Publications:

Book Chapters

• K. J. Chen and S. Yang, "Recent Progress in GaN-on-Si HEMT," in HANDBOOK OF GaN SEMICONDUCTOR MATERIALS AND DEVICES, CRC Press, Taylor & Francis Group, International Standard Book Number-13: 978-1-4987-4713-4 (Hardback). Chapter 11, 2018.

• K. J. Chen, "Fluorine-Implanted Enhancement-Mode Transistors" in Power GaN Devices, Springer International Publishing, ISBN: 978-3-319-43197-0, Chapter 12, pp. 273-293, 2016.

• K. J. Chen and L. L. W. Leung, "CMOS-compatible micromachined edge-suspended planar inductors and coplanar waveguides" in Si-Based Semiconductor Components for RF Integrated Circuits, Transworld Research Network, Ed. Will Z. Cai, ISBN: 81-7895-196-7, Chapter 8, pp. 217-242, 2006.

Recent Journal Papers (2003-present) (Full List )

2018:

• X. Tang, B. Li, K. J. Chen, and J. Wang, "Photocurrent characteristics of metal-AlGaN/GaN Schottky-on-heterojunction diodes induced by GaN interband excitation," Appl. Phys. Express, 11, 054101, 2018.
• Q. Qian, Z. Zhang, and K. J. Chen, "Layer-dependent second-order Raman intensity of MoS₂ and WSe₂: influence of intervalley scattering," Physical Review B, 97, 165409, 2018.
• (Invited Paper) H. Amano, et al., "The 2018 GaN power electronics roadmap, " J. Phys. D: Appl. Phys. 51 (2018) 163001.
  

• Q. Qian, Z. Zhang, and K. J. Chen, "In Situ Resonant Raman Spectroscopy to Monitor the Surface Functionalization of MoS₂ and WSe₂ for High-k Integration: A First-Principles Study," Langmuir, 34, pp. 2882-2889, 2018. DOI: 10.1021/acs.langmuir.7b03840.

• M. Hua, Q. Qian, J. Wei, Z. Zhang, G. Tang, and K. J. Chen, "Bias Temperature Instability of Normally-Off GaN MIS-FET with Low-Pressure Chemical Vapor Deposition SiN_x Gate Dielectric, " Phys. Status Solidi A, 2018, 1700641, DOI: 10.1002/pssa.201700641.

• J. Lei, J. Wei, G. Tang, Z. Zhang, Q. Qian, Z. Zheng, Mengyuan, and K. J. Chen, "650-V Double-Channel Lateral Schottky Barrier Diode with Dual-Recess Gated Anode," IEEE Electron Device Lett., IEEE Electron Device Lett., vol. 39, no. 2, pp. 260-263, Feb. 2018.

• M. Hua, J. Wei, Q. Bao, Z. Zhang, Z. Zheng, and K. J. Chen, "Dependence of V_TH Stability on Gate-Bias under Reverse-Bias Stress in E-mode GaN MIS-FET," IEEE Electron Device Lett., vol. 39, No. 3, pp. 413-416, 2018, DOI: 10.1109/LED.2018.2791664.

• S. Huang, X. Liu, X. Wang, X. Kang, J. Zhang, J. Fan, J. Shi, K. Wei, Y. Zheng, H. Gao, Q. Sun, M. Wang, B. Shen, and K. J. Chen, "Ultrathin-Barrier AlGaN/GaN Heterostructure: A Recess-Free Technology for Manufacturing High-Performance GaN-on-Si Power Devices," IEEE Trans. Electron Devices, vol. 65, no. 1, pp. 207-214, 2018.

• J. Wei, J. Lei, X. Tang, B. Li, S. Liu, and K. J. Chen, "Channel-to-Channel Coupling in Normally-Off GaN Double-Channel MOS-HEMT," IEEE Electron Device Lett., vol. 39, no. 1, pp. 59-62, 2018.

• K. Kim, M. Hua, D. Liu, J. Kim, K. J. Chen, and Z. Ma, "Efficiency enhancement of InGaN/GaN blue light-emitting diodes with top surface deposition of AlN/Al₂O₃," Nano Energy, 43 (2018) 259-269.

2017:

• S. Yang, C. Zhou, S. Han, J. Wei, K. Sheng, and K. J. Chen, "Impact of Substrate Bias Polarity on Buffer-Related Current Collapse in AlGaN/GaN-on-Si Power Devices," IEEE Trans. Electron Devices, vol. 64, no. 12, pp. 5048-5056, 2017.

• Q. Qian, Z. Zhang, M. Hua, J. Wei, J. Lei, and K. J. Chen, "Remote N₂ Plasma Treatment to Deposit Ultrathin High-k Dielectric As Tunneling Contact Layer for Single-layer MoS₂ MOSFET," Appl. Phys. Express, vol. 10, p. 125201, 2017.

• Z. Zhang, B. Li, Member, Q. Qian, X. Tang, M. Hua, B. Huang, and K. J. Chen, "Revealing the Nitridation Effects on GaN Surface by First-Principles Calculation and X-Ray/Ultraviolet Photoemission Spectroscopy," IEEE Trans. Electron Devices, vol. 64, No. 10, p. 4036-4036, 2017.

• G. Tang, A. M. H. Kwan, R. K. Y. Wong, J. Lei, R. Y. Su, F. W. Yao, Y. M. Lin, J. L. Yu, T. Tsai, H. C. Tuan, A. Kalnitsky, and K. J. Chen, "Digital Integrated Circuits on an E-mode GaN Power HEMT Platform," IEEE Elec. Dev. Lett., vol. 38, No. 9, pp. 1282-1285, 2017.

• S. Liu, M. Wang, M. Tao, R. Yin, J. Gao, H. Sun, W. Lin, C. P. Wen, J. Wang, W. Wu, Y. Hao, Z. Zhang, K. J. Chen, and B. Shen, "Gate-Recessed Normally-OFF GaN MOSHEMT with Improved Channel Mobility and Dynamic Performance Using AlN/Si3N4 as Passivation and Post Gate-Recess Channel Protection Layers," IEEE Elec. Dev. Lett., vol. 38, No. 8, pp. 1075-1078, 2017.
• G. Tang, J. Wei, Z. Zhang, X. Tang, M. Hua, H. Wang, and K. J. Chen, "Dynamic R_ON of GaN-on-Si Lateral Power Devices with a Floating Substrate Termination," IEEE Elec. Dev. Lett., vol. 38, No. 7, pp. 937-940, 2017.
• M. Hua, J. Wei, G. Tang, Z. Zhang, Q. Qian, X. Cai, N. Wang, and K. J. Chen, "Normally-Off LPCVD-SiNx/GaN MIS-FET with Crystalline Oxidation Interlayer," IEEE Elec. Dev. Lett., vol. 7, No. 38, pp. 929-932, 2017.
• M. Zhang, J. Wei, H. Jiang, K. J. Chen, and C. H. Cheng, "A New SiC Trench MOSFET Structure With Protruded p-Base for Low Oxide Field and Enhanced Switching Performance," IEEE Trans. Device and Materials Reliability, vol. 17, No. 2, pp. 432-437, 2017.
• M. Zhang, J. Wei, H. Jiang, K. J. Chen, and C. Cheng, "SiC trench MOSFET with self-biased p-shield for low RON-SP and low OFF-state oxide field," IET Power Electron., vol. 10, no. 10, No. 10, pp. 1208-1213, 2017.
• J. Wei, M. Zhang, H. Jiang, H. Wang, and K. J. Chen, "Dynamic Degradation in SiC Trench MOSFET with a Floating p-Shield Revealed With Numerical Simulations," IEEE Trans. Electron Devices, vol. 64, No. 6, pp. 2592-2598, 2017.
• Q. Qian, Z. Zhang, M. Hua, G. Tang, J. Lei, F. Lan, Y. Xu, R. Yan, and K. J. Chen, "Enhanced dielectric deposition on single-layer MoS₂ with low damage using remote N₂ plasma treatment," Nanotechnology, vol. 28, No. 17, p. 175202, 2017.
• (Invited Paper) K. J. Chen, O. Häberlen, A. Lidow, C. L. Tsai, T. Ueda, Y. Uemoto, and Y. Wu, "GaN-on-Si Power Technology: Devices and Applications," IEEE Trans. Electron Devices, vol. 64, No. 3, pp. 779-795, 2017.
• R. Xie, H. Wang, G. Tang, X. Yang, and K. J. Chen, "An Analytical Model for False Turn-On Evaluation of High-Voltage Enhancement-Mode GaN Transistor in Bridge-Leg Configuration," IEEE Trans. Power Electronics, vol. 32, No. 8, pp. 6416-6488, 2017.
• H. Wang, J. Wei, R. Xie, C. Liu, G. Tang, and K. J. Chen, "Maximizing the Performance of 650-V p-GaN Gate HEMTs: Dynamic RON Degradation and Circuit Design Considerations," IEEE Trans. Power Electronics, vol. 32, No. 7, pp. 5539-5549, 2017.
• S. Yang, S. Liu, Y. Lu, and K. J. Chen, "Trapping mechanisms in insulated-gate GaN power devices: Understanding and characterization techniques," physica status solidi (a), vol. 214, p. 1600607, 2017.

2016:

• S. Huang, X. Liu, X. Wang, X. Kang, J. Zhang, Q. Bao, K. Wei, Y. Zheng, C. Zhao, H. Gao, Q. Sun, Z. Zhang, and K. J. Chen, "High Uniformity Normally-OFF GaN MIS-HEMTs Fabricated on Ultra-Thin-Barrier AlGaN/GaN Heterostructure," IEEE Elec. Dev. Lett., vol. 37, No. 12, pp. 1617-1620, 2016.
• B. Li, X. Tang, G. Tang, J. Wei, J. Wang, and K. J. Chen, "Switching Behaviors of On-Chip Photon Source on AlGaN/GaN-on-Si Power HEMTs Platform," IEEE Photonics Technology Lett., vol. 28, pp. 2803-2806, 2016.

• J. Wei, M. Zhang, H. Jiang, C. Cheng, and K. J. Chen, "Low ON-Resistance SiC Trench/Planar MOSFET With Reduced OFF-State Oxide Field and Low Gate Charges," IEEE Elec. Dev. Lett., vol. 37, pp. 1458-1461, 2016.
• X. Tang, B. Li, Z. Zhang, G. Tang, J. Wei, and K. J. Chen, "Characterization of Static and Dynamic Behaviors in AlGaN/GaN-on-Si Power Transistors With Photonic-Ohmic Drain," IEEE Trans. Electron Devices, vol. 63, pp. 2831-2837, 2016.
• Q. Qian, B. Li, M. Hua, Z. Zhang, F. Lan, Y. Xu, R. Yan, and K. J. Chen, "Improved Gate Dielectric Deposition and Enhanced Electrical Stability for Single-Layer MoS₂ MOSFET with an AlN Interfacial Layer," Scientific Reports, vol. 6, p. 27676, 2016.
• J. Wei, H. Jiang, Q. Jiang, and K. J. Chen, "Proposal of a GaN/SiC Hybrid Field-Effect Transistor for Power Switching Applications," IEEE Trans. Electron Devices, vol. 63, pp. 2469-2473, 2016.

• (Feature Article) K. J. Chen, S. Yang, S. Liu, C. Liu, and M. Hua, "Toward reliable MIS- and MOS-gate structures for GaN lateral power devices," Phys. Status Solidi A, vol. 213, pp. 861-867, 2016.
• M. Hua, Y. Lu, S. Liu, C. Liu, K. Fu, Y. Cai, B. Zhang, and K. J. Chen, "Compatibility of AlN/SiNx Passivation With LPCVD-SiN_x Gate Dielectric in GaN-Based MIS-HEMT," IEEE Elec. Dev. Lett., vol. 37, No. 3, pp. 265-268, 2016.
• (Invited Article) B. Li, X. Tang, J. Wang, and K. J. Chen, "Optoelectronic Devices on AlGaN/GaN HEMT Platform, " Phys. Status Solidi A, vol. 213, No. 5, pp. 1213-1221, 2016.
• X. Tang, B. Li, Y. Lu, and K. J. Chen, "On-chip Addressable Schottky-on-Heterojunction Light-Emitting Diode Arrays on AlGaN/GaN-on-Si Platform, " Phys. Status Solidi C, vol. 13, No. 5-6, pp. 365-368, 2016.

• S. Yang, Y. Lu, H. Wang, S. Liu, C. Liu, and K. J. Chen, "Dynamic Gate Stress-Induced V_TH Shift and Its Impact on Dynamic R_ON in GaN MIS-HEMTs," IEEE Elec. Dev. Lett., vol. 37, pp. 157-160, 2016.
• S. Yang, S. Liu, C. Liu, M. Hua, and K. J. Chen, "Gate Stack Engineering for GaN Lateral Power Transistors, " Semicond. Sci. Technol. 31, 024001, 2016.

2015:

• J. Wei, S. Liu, B. Li, X. Tang, Y. Lu, C. Liu, M. Hua, Z. Zhang, G. Tang, and K. J. Chen, "Low On-Resistance Normally-Off GaN Double-Channel Metal-Oxide-Semiconductor High-Electron-Mobility Transistor, " IEEE Elec. Dev. Lett., vol. 36, No. 12, pp. 1287-1290, 2015.
• M. Hua, C. Liu, S. Yang, S. Liu, K. Fu, Z. Dong, Y. Cai, B. Zhang, and K. J. Chen, "Characterization of Leakage and Reliability of SiN_x Gate Dielectric by Low-Pressure Chemical Vapor Deposition for GaN-based MIS-HEMTs, " IEEE Trans. Electron Devices, vol. 62, No. 10, pp. 3215-3222, 2015.
• X. Wang, J. Xu, Z. Wang, K. J. Chen, X. Wu, Z. Wang, P. Yang, and L. H. K. Duong, "An Analytical Study of Power Delivery Systems for Many-Core Processors Using On-Chip and Off-Chip Voltage Regulators, " IEEE Trans. Computer-Aided Design Of Integrated Circuits And Systems, vol. 34, No. 9, pp. 1401-1414, 2015.
• C. Zhang, M. Wang, B. Xie, C. P. Wen, J. Wang, Y. Hao, W. Wu, K. J. Chen, and B. Shen, "Temperature Dependence of the Surface- and Buffer-Induced Current Collapse in GaN High-Electron Mobility Transistors on Si Substrate, " IEEE Trans. Electron Devices, vol. 62, NO. 8, pp. 2475-2480, 2015.
• H. Wang, C. Liu, Q. Jiang, Z. Tang, and K. J. Chen, "Dynamic Performance of AlN-Passivated AlGaN/GaN MIS-High Electron Mobility Transistors Under Hard Switching Operation, " IEEE Elec. Dev. Lett., vol. 36, No. 8, pp. 760-762, 2015.
• S. Lin, M. Wang, B. Xie, C. P. Wen, M. Yu, J. Wang, Y. Hao, W. Wu, S. Huang, K. J. Chen, and B. Shen, "Reduction of Current Collapse in GaN High-Electron Mobility Transistors Using a Repeated Ozone Oxidation and Wet Surface Treatment, " IEEE Elec. Dev. Lett., vol. 36, No. 8, pp. 757-759, 2015.
• S. Huang, X. Liu, J. Zhang, K. Wei, G. Liu, X. Wang, Y. Zheng, H. Liu, Z. Jin, C. Zhao, C. Liu, S. Liu, S. Yang, J. Zhang, Y. Hao, and K. J. Chen, "High RF Performance Enhancement-Mode Al₂O₃/AlGaN/GaN MIS-HEMTs Fabricated With High-Temperature Gate-Recess Technique, " IEEE Elec. Dev. Lett., vol. 36, No. 8, pp. 754-756, 2015.
• S. Yang, S. Liu, Y. Lu, C. Liu, and K. J. Chen, "AC-Capacitance Techniques for Interface Trap Analysis in GaN-Based Buried-Channel MIS-HEMTs, " IEEE Trans. Electron Devices, vol. 62, No. 6, pp. 1870-1878, 2015.
• Y. Lu, Q. Jiang, Z. Tang, S. Yang, C. Liu, and K. J. Chen, "Characterization of SiN_x/AlN passivation stack with epitaxial AlN grown on AlGaN/GaN heterojunctions by plasma-enhanced atomic layer deposition, " Appl. Phys. Express 8, 064101, 2015.
• H. Wang, A. M. Kwan, Q. Jiang, and K. J. Chen, "A GaN Pulse Width Modulation Integrated Circuit for GaN Power Converters, " IEEE Trans. on Electron Devices, vol. 62, No. 4, pp. 1143-1149, 2015.
• B. Li, X. Tang, and K. J. Chen, "Optical pumping of deep traps in AlGaN/GaN-on-Si HEMTs using an on-chip Schottky-on-heterojunction light-emitting diode, " Appl. Phys. Lett., 106(9), 093505, 2015.
• M. Hua, C. Liu, S. Yang, S. Liu, K. Fu, Z. Dong, Y. Cai, B. Zhang, and K. J. Chen, "GaN-Based Metal-Insulator-Semiconductor High-Electron-Mobility Transistors Using Low Pressure Chemical Vapor Deposition Silicon Nitride (LPCVD-SiN_x) as Gate Dielectric," IEEE Elec. Dev. Lett., vol. 36, No. 5, pp. 448-450, 2015.
• Y. Lu, B. Li, X. Tang, Q. Jiang, S. Yang, Z. Tang, and K. J. Chen, "Normally OFF Al₂O₃-AlGaN/GaN MIS-HEMT With Transparent Gate Electrode for Gate Degradation Investigation, " IEEE Trans. Electron Devices, vol. 62, No. 3, pp. 821-827, 2015.
• S. Liu, S. Yang, Z. Tang, Q. Jiang, C. Liu, M. Wang, B. Shen, and K. J. Chen, "Interface/border trap characterization of Al₂O₃/AlN/GaN metal-oxide-semiconductor structures with an AlN interfacial layer, " Appl. Phys. Lett., 106(5), 051605, 2015.
• C. Liu, S. Yang, S. Liu, Z. Tang, H. Wang, Q. Jiang, and K. J. Chen, "Thermally Stable Enhancement-Mode GaN Metal-Insulator-Semiconductor High-Electron-Mobility Transistor With Partially Recessed Fluorine-Implanted Barrier, " IEEE Elec. Dev. Lett., vol. 36, No. 4, pp. 318-320, 2015.
• S. Huang, X. Liu, K. Wei, G. Liu, X. Wang, B. Sun, X. Yang, B. Shen, C. Liu, S. Liu, M. Hua, S. Yang, and K. J. Chen, "O₃-sourced atomic layer deposition of high quality Al₂O₃ gate dielectric for normally-off GaN metal-insulator-semiconductor high-electron-mobility transistors, " Appl. Phys. Lett., 106(3), 033507, 2015.

2014:

• S. Yang, S. Liu, C. Liu, Y. Lu, and K. J. Chen, "Mechanisms of thermally induced threshold voltage instability in GaN-based heterojunction transistors," Appl. Phys. Lett., 105(22), 223508, 2014.
• (Invited) K. J. Chen, S. Yang, Z. Tang, S. Huang, Y. Lu, Q. Jiang, S. Liu, C. Liu, and B. Li, "Surface nitridation for improved dielectric/III-nitride interfaces in GaN MIS-HEMTs, " Phys. Stat. Sol. (a), vol. 212, No. 5, pp. 1059-1065, 2015.
• Q. Jiang, Z. Tang, C. Zhou, S. Yang, and K. J. Chen, "Substrate-Coupled Cross-Talk Effects on an AlGaN/GaN-on-Si Smart Power IC Platform," IEEE Trans. on Electron Devices, vol. 61, No. 11, pp. 3808-3813, 2014.
• A. M. Kwan, Y. Guan, X. Liu, and K. J. Chen, "A Highly Linear Integrated Temperature Sensor on a GaN Smart Power IC Platform," IEEE Trans. on Electron Devices, vol. 61, No. 8, pp. 2970-2976, 2014.
• Z. Tang, S. Huang, X. Tang, B. Li, and K. J. Chen, "Influence of AlN Passivation on Dynamic ON-Resistance and Electric Field Distribution in High-Voltage AlGaN/GaN-on-Si HEMTs," IEEE Trans. on Electron Devices, vol. 61, No. 8, pp. 2785-2792, 2014.
• B. Li, X. Tang, J. Wang, and K. J. Chen, "P-doping-free III-nitride high electron mobility light-emitting diodes and transistors," Appl. Phys. Lett., 105(3), 032105, 2014.
• S. Liu, S. Yang, Z. Tang, Q. Jiang, C. Liu, M. Wang, and K. J. Chen, "Al₂O₃/AlN/GaN MOS-Channel-HEMTs With an AlN Interfacial Layer," IEEE Elec. Dev. Lett., vol. 35, No. 7, pp. 723-725, 2014.
• M. Wang, Y. Wang, C. Zhang, B. Xie, C. P. Wen, J. Wang, Y. Hao, W. Wu, K. J. Chen, and B. Shen, "900 V/1.6 mΩ.cm² Normally Off Al₂O₃/GaN MOSFET on Silicon Substrate," IEEE Trans. on Electron Devices, vol. 61, No. 6, pp. 2035-2040, 2014.
• Q. Jiang, Z. Tang, C. Liu, Y. Lu, and K. J. Chen, "A High-Voltage Low-Standby-Power Startup Circuit Using Monolithically Integrated E/D-Mode AlGaN/GaN MIS-HEMTs, " IEEE Trans. on Electron Devices, vol. 61, No. 3, pp. 762-768, 2014.
• A. Zhang, L. Zhang, Z. Tang, X. Cheng, Y. Wang, K. J, Chen, and M. Chan, "Analytical Modeling of Capacitances for GaN HEMTs, Including Parasitic Components, " IEEE Trans. on Electron Devices, vol. 61, No. 3, pp. 755-761, 2014.
• S. Huang, K. Wei, G. Liu, Y. Zheng, X. Wang, L. Pang, X. Kong, X. Liu, Z. Tang, S. Yang, Q. Jiang, and K. J. Chen, "High- f_MAX High Johnson's Figure-of-Merit 0.2-um Gate AlGaN/GaN HEMTs on Silicon Substrate With AlN/SiN_x Passivation, " IEEE Elec. Dev. Lett., vol. 35, No. 3, pp. 315-317, 2014.
• C. Liu, S. Liu, S. Huang, B. Li, and K. J. Chen, "AlN/GaN heterostructure TFTs with plasma enhanced atomic layer deposition of epitaxial AlN thin film," Physica Status Solidi (C), vol. 11, No. 3-4, pp. 953-956, 2014
• B. Li, Q. Jiang, S. Liu, C. Liu, and K. J. Chen, "Degradation of transient OFF-state leakage current in AlGaN/GaN HEMTs induced by ON-state gate overdrive," Physica Status Solidi (C), vol. 11, No. 3-4, pp. 928-931, 2014.
• S. Yang, Q. Jiang, B. Li, Z. Tang, and K. J. Chen, "GaN-to-Si vertical conduction mechanisms in AlGaN/GaN-on-Si lateral heterojunction FET structures, " Physica Status Solidi (C), vol. 11 No. 3-4, pp. 949-952, 2014.
• (Invited) K. J. Chen, A. M. H. Kwan, and Q. Jiang, "Technology for III-N heterogeneous mixed-signal electronics," Physica Status Solidi (a), vol. 211, No. 4, pp. 769-774, 2014.
• S. Yang, C. Zhou, Q. Jiang, J. Lu, B. Huang, and K. J. Chen, "Investigation of buffer traps in AlGaN/GaN-on-Si devices by thermally stimulated current spectroscopy and back-gating measurement," Appl. Phys. Lett., 104(1), 013504, 2014.
• Q. Zhou, S. Yang, W. Chen, B. Zhang, Z. Feng, S. Cai, and K. J. Chen, "High voltage InAlN/GaN HEMTs with nonalloyed Source/Drain for RF power applications," Solid-State Electronics, vol. 91, pp. 19-23, 2014.

2013:

• S. Yang, Z. Tang, K. -Y. Wong, Y. -S. Lin, C. Liu, Y. Lu, S. Huang, and K. J. Chen, "High-quality interface in Al₂O₃/GaN/AlGaN/GaN MIS Structures with in situ pre-gate plasma nitridation," IEEE Elec. Dev. Lett., vol. 34, No. 12, pp. 1497-1499, 2013.

• Z. Tang, Q. Jiang, Y. Lu, S. Huang, S. Yang, X. Tang, and K. J. Chen, "600-V normally-off SiN_x/AlGaN/GaN MIS-HEMT with large gate swing and low current collapse," IEEE Elec. Dev. Lett., vol. 34, No. 11, pp. 1373-1375, 2013.

• Y. Wang, M. Wang, B. Xie, C. P. Wen, J. Wang, Y. Hao, W. Wu, K. J. Chen, and B. Shen, "High-Performance Normally-Off Al₂O₃/GaN MOSFET Using a Wet Etching-Based Gate Recess Technique," IEEE Elec. Dev. Lett., vol. 34, No. 11, pp. 1370-1372, 2013.

• Q. Zhou, W. Chen, C. Zhou, B. Zhang, and K. J. Chen, "High sensitivity AlGaN/GaN lateral field-effect rectifier for zero-bias microwave detection," Electronics Lett., vol. 49, No. 22, 2013.
S. Huang, K. Wei, Z. Tang, S. Yang, C. Liu, L. Guo, B. Shen, J. Zhang, X. Kong, G. Liu, Y. Zheng, X. Liu, and K. J. Chen, "Effects of interface oxidation on the transport behavior of the two-dimensional-electron-gas in AlGaN/GaN heterostructures by plasma-enhanced-atomic-layer-deposited AlN passivation," J. Appl. Phys., 114, 144509, 2013.

• S. Yang, S. Huang, Q. Zhou, M. Schnee, Q.-T. Zhao, J. Schubert, and K. J. Chen, "Fabrication and characterization of enhancement-mode high-K LaLuO₃-AlGaN/GaN MIS-HEMTs," IEEE Trans. on Electron Devices, vol. 60, No. 10, pp. 3040-3046, 2013.

• Y. Lu, S. Yang, Q. Jiang, Z. Tang, B. Li, and K. J. Chen, "Characterization of V_T-instability in enhancement-mode Al₂O₃-AlGaN/GaN MIS-HEMTs," Phys. Sta. Sol. (C), 10, No. 11, pp. 1397-1400, 2013.

• C. Liu, S. Liu, S. Huang, and K. J. Chen, "Plasma-enhanced atomic layer deposition of AlN epitaxial thin film for AlN/GaN heterostructure TFTs," IEEE Elec. Dev. Lett., vol. 34, No. 9, pp. 1106-1108, 2013.

• A. M. H. Kwan, Y. Guan, X. Liu, and K. J. Chen, "Integrated over-temperature protection circuit for GaN smart power ICs," Jpn. J. Appl. Phys., 52, 08JN15, 2013.

• S. Yang, S. Huang, Q. Zhou, M. Schnee, Q.-T. Zhao, J. Schubert, and K. J. Chen, "Enhancement-mode LaLuO₃-AlGaN/GaN Metal-Insulator-Semiconductor High-Electron-Mobility-Transistors using fluorine plasma ion implantation," Jpn. J. Appl. Phys., 52, 08JN02, 2013.

• (Invited) K. J. Chen, and S. Huang, "AlN passivation by plasma-enhanced atomic layer deposition for GaN-based power switches and power amplifiers," Semiconductor Science and Technology, vol. 28, No. 7, 074015, 2013.

• X. Liu, C. Zhan, K. W. Chan, MHS. Owen, W. Liu, D. Z. Chi, L. S. Tan, K. J. Chen, and Y. C. Yeo, "AlGaN/GaN metal-oxide-semiconductor high-electron-mobility-transistors with a high breakdown voltage of 1400 V and a complementary metal-oxide-semiconductor compatible gold-free process," Jpn. J. Appl. Phys., 52, 04CF06, 2013.

• Q. Zhou, W. Chen, S. Liu, B. Zhang, Z. Feng, S. Cai, and K. J. Chen, "Schottky-contact technology in InAlN/GaN HEMTs for breakdown voltage improvement," IEEE Trans. on Electron Devices, vol. 60, No. 3, pp. 1075-1081, 2013.

• Z. Tang, S. Huang, Q. Jiang, S. Liu, C. Liu, and K. J. Chen, "High-voltage (600V) low-leakage low-current-collapse AlGaN/GaN HEMTs with AlN/SiN_x passivation," IEEE Elec. Dev. Lett., vol. 34, No. 3, pp. 366-368, 2013.

• Q. Jiang, C. Liu, Y. Lu, and K. J. Chen, "1.4 kV AlGaN/GaN HEMTs on a GaN-on-SOI platform," IEEE Elec. Dev. Lett., vol. 34, No. 3, pp. 357-359, 2013.

• S. Huang, Q. Jiang, S. Yang, Z. Tang, and K. J. Chen, "Mechanism of PEALD-grown AlN passivation for AlGaN/GaN HEMTs: compensation of interface traps by polarization charges," IEEE Elec. Dev. Lett., vol. 34, No. 2, pp. 193-195, 2013.

• A. W. H. Kwan and K. J. Chen, "A gate overdrive protection technique for improved reliability in AlGaN/GaN enhancement-mode HEMTs," IEEE Elec. Dev. Lett., vol. 34, No. 1, pp. 30-32, 2013.

• W. Chen, J. Zhang, Z. Wang, J. Wei, B. Zhang, and K. J. Chen, "Investigation of device geometry- and temperature-dependent characteristics of AlGaN/GaN lateral field-effect rectifier," Semicond. Sci. Technol., vol. 28, 015021, 2013.

• Z. Dong, S. Tan, Y. Cai, H. Chen, S. Liu, J. Xu, L. Xue, G. Yu, Y. Wang, D. Zhao, K. Hou, K. J. Chen, and B. Zhang, "5.3A/400V normally-off AlGaN/GaN-on-Si MOS-HEMT with high threshold voltage and large gate swing," Electronics Letters, vol. 49, No. 3, pp. 221-222, 2013.

2012:

• X. Wang, S. Liu, D. Ma, X. Zheng, G. Chen, F. Xu, N. Tang, B. Shen, P. Zhang, X. Caom, B. Wang, S. Huang, K. J. Chen, S. Zhou, and A. Yoshikawa, "Fe-doped InN layers grown by molecular beam epitaxy," Appl. Phys. Lett., 101, 171905, 2012.

• J. Fu, L. Yuan, and L. Yobas, and K. J. Chen, "UV-illuminated Dielectrophoresis by Two-Dimensional Electron Gas (2DEG) in AlGaN/GaN Heterojunction," Phys. Stat. Sol. (a), 28042, 2012.

• Zhou, Q. Jiang, S. Huang, and K. J. Chen, "Vertical leakage/breakdown mechanisms in AlGaN/GaN-on-Si devices," IEEE Elec. Dev. Lett., 2012, vol. 33, No. 8, pp. 1132-1134, 2012.

• S. Yang, S. Huang, H. Chen, C. Zhou, Q. Zhou, M. Schnee, Q.-T. Zhao, J. Schubert, and K. J. Chen, "AlGaN/GaN MISHEMTs with High-K LaLuO₃ Gate Dielectric," IEEE Elec. Dev. Lett., 2012, vol. 33, No. 7, pp. 979-981, 2012.

• X. Liu, C. Zhan, K. W. Chan, W. Liu, L. S. Tan, K. J. Chen and Y.-C. Yeo, "AlGaN/GaN-on-Silicon MOS-HEMTs with Breakdown Voltage of 800 V and On-State Resistance of 3 mΩ.cm² using a CMOS-Compatible Gold-Free Process," Appl. Phys. Express, 5, 066501, 2012.

• S. Huang, Q. Jiang, S. Yang, C. Zhou, and K. J. Chen, "Effective Passivation of AlGaN/GaN HEMTs by ALD-Grown AlN Thin Film, " IEEE Elec. Dev. Lett., vol. 33, No. 4, pp. 516-518, 2012.

• S. Liu, Y. Cai, G. Gu, J. Wang, C. Zeng, W. Shi, Z. Feng, H. Qin, Z. Cheng, K. J. Chen, and B. Zhang, "Enhancement-mode operation of nano-channel Array (NCA) AlGaN/GaN HEMTs," IEEE Elec. Dev. Lett., vol. 33, No. 3, pp. 354-356, 2012.

• H. Chen, L. Yuan, Q. Zhou, C. Zhou, and K. J. Chen, "Normally-off AlGaN/GaN power tunnel-junction FETs," Phys. Stat. Sol. C, No. 3-4, pp. 871-874, 2012.

• S. Huang, S. Yang, J. Roberts, and K. J. Chen, "Characterization of Vth-instability in Al₂O₃/GaN/AlGaN/GaN MIS-HEMTs by quasi-static C-V measurement," Phys. Stat. Sol. C, No. 3-4, pp. 923-926, 2012.

• Q. Zhou, H. Chen, C. Zhou, Z. H. Feng, S. J. Cai, and K. J. Chen, "Schottky source/drain InAlN/AlN/GaN MISHEMT with enhanced breakdown voltage," IEEE Elec. Dev. Lett., vol. 33, No. 1, pp. 38-40, 2012.

• J. -Y. Lu, H. Ren, D. Deng, Y. Wang, K. J. Chen, K. M. Lau, and T. Y. Zhang, "Thermally activated pop-in and indentation size effects in GaN films," J. Phys. D: Appl. Phys. 45 (2012) 085301.
• S. Jha, H. E. Wang, O. Kutsay, E.V. Jelenkovic, K. J. Chen, I. Bello, V. Kremnican, J. A. Zapien, "Exploiting nanostructure-thin film interfaces in advanced sensor device configurations", Vacuum, vol. 86, pp. 757-760, 2012.

2011:

• C. Ma, H. Chen, C. Zhou, S. Huang, L. Yuan, J. Roberts, and K. J. Chen, "ON-state critical gate overdrive voltage for fluorine-implanted enhancement-mode AlGaN/GaN high electron mobility transistors," J. Appl. Phys., 110, 114514, 2011. 

• S. Huang, S. Yang, J. Roberts, and K. J. Chen, "Threshold voltage instability in Al₂O₃/GaN/AlGaN/GaN metal-insulator-semiconductor high electron mobility transistors," Jpn. J. Appl. Phys., 50, 110202, 2011.

• S. Yang, S. Huang, H. Chen, M. Schnee, Q.-T. Zhao, J. Schubert, and K. J. Chen, "Characterization of high-k LaLuO₃ thin film grown on AlGaN/GaN heterostructure by molecular beam deposition," Appl. Phys. Lett., 99, 182103, 2011.

• L. Yuan, H. Chen, Q. Zhou, C. Zhou, and K. J. Chen, "Gate-induced Schottky barrier lowering effect in AlGaN/GaN metal-2DEG tunnel junction field effect transistor," IEEE Elec. Dev. Lett., vol. 32, No. 9, pp. 1221-1223, 2011.

• B. K. Li, M. J. Wang, K. J. Chen, and J. N. Wang, "Enhanced electroluminescence from the fluorine-plasma implanted Ni/Au-AlGaN/GaN Schottky diode," Appl. Phys. Lett., 99, 062101, 2011.

• H. Chen, M. J. Wang, and K. J. Chen, "Enhancement-mode AlGaN/GaN HEMTs fabricated by standard fluorine ion implantation with a Si₃N₄ energy-absorbing layer," Electrochem. Solid-State Lett. vol. 14, No. 6, pp. H229-231, 2011.

• A. M. H. Kwan, K. -Y. Wong, Xiaosen Liu, and K. J. Chen, "High-gain and high-bandwidth AlGaN/GaN high electron mobility transistor comparator with high-temperature operation," Jpn, J. Appl. Phys. Vol. 50, No. 4, 2011.

• M. J. Wang and K. J. Chen, "Kink effect in AlGaN/GaN HEMTs induced by drain and gate pumping," IEEE Electron Device Letters, vol. 32, No. 4, pp. 482-484, Apr. 2011.
• H. Zhang, S. Bowman, and K. J. Chen, "Efficient parameter extraction of microwave coupled-resonator filter using genetic algorithms," Int. J. of RF and Microwave Computer-Aided Engineering, vol. 21, No. 2, pp. 137-144, Mar. 2011.

• J. -Y. Lu, D. Deng, Y. Wang, K. J. Chen, K. M. Lau, and T. Y. Zhang, "Phonon deformation potentials of hexagonal GaN studied by biaxial stress modulation," AIP Advances, 1 (2011) 032132.

• L. Yuan, H. Chen, and K. J. Chen, "Normally-off AlGaN/GaN metal-2DEG tunnel-junction field-effect transistors," IEEE Electron Device Letters, vol. 32, No. 3, pp. 303-305, 2011.

• J. Fu and K. J. Chen, "Microspheres manipulation system by patterned AlGaN/GaN 2DEG electrodes" Phys. Sta. Sol. (c), 8, No. 7-8, pp. 2479-2482, 2011.

• S. Huang, H. Chen, and K. J. Chen, "Surface properties of AlGaN/GaN heterostructures treated by fluorine plasma: an XPS study," Phys. Status Solidi C, 8, No. 7-8, pp. 2200-2203, 2011.

• M. J. Wang and K. J. Chen, "Improvement of the Off-State Breakdown Voltage with Fluorine Ion Implantation in AlGaN/GaN HEMTs," IEEE Trans. Electron Devices, vol. 58, No. 2, pp. 460-465. 2011.

• X. Liu and K. J. Chen, "GaN Single-Polarity Power Supply Bootstrapped Comparator for High Temperature Electronics," IEEE Electron Device Letters, vol. 32, No. 1, pp. 27-29, Jan. 2011.

• (Invited) K. J. Chen and C. Zhou, "Enhancement-mode AlGaN/GaN HEMT and MIS-HEMT Technology," Phys. Sta. Sol. (a), 208, No. 2, pp. 434-438. Feb. 2011.

2010:

• Z. H. Feng, R. Zhou, S. Y. Xie, J. Y. Yin, J. X. Fang, B. Liu, W. Zhou, K. J. Chen, S. J. Cai, "18-GHz 3.65W/mm Enhancement-mode AlGaN/GaN HFET using Fluorine Plasma Ion Implantation," IEEE Electron Device Letters, vol. 31, no. 12, pp. 1386-1388, Dec. 2010.

• J. -Y. Lu, Z.-J. Wang, D. -M. Deng, Y. Wang, K. J. Chen, K. M. Lau, and T.-Y. Zhang, "Determining phonon deformation potentials of hexagonal GaN with stress modulation," J. Appl. Phys., 108, 123420, 2010.

• W. Chen, C. Zhou, and K. J. Chen, "High-current-density high-voltage normally-off AlGaN/GaN hybrid-gate HEMT with low on-resistance," Electronics Letters, vo. 46, No. 24, pp. 1626-1627, 2010.

• T. Chang, T. -H. Hsu, E. Y. Chang, Y. -C. Chen, H. -D. Trinh and K. J. Chen, "Normally-off operation AlGaN/GaN MOS-HEMT with high threshold voltage," Electronics Letters, vol. 46, No. 18, pp. 1280-1281, 2010.

• S. Huang, H. Chen, and K. J. Chen, "Effect of the fluorine plasma treatment on the surface potential and Schottky barrier height of AlGaN/GaN heterostructures," Appl. Phys. Lett., 96, 233510, 2010.

• K. -Y. Wong, W. Chen, and K. J. Chen, "Characterization and analysis of the temperature-dependent on-resistance in AlGaN/GaN lateral field-effect rectifiers," IEEE Trans. Electron Devices, vol. 57, No. 8, pp. 1924-1929, 2010.

• M. J. Wang and K. J. Chen, "Off-state Breakdown Characterization in AlGaN/GaN HEMT Using Drain Injection Technique" IEEE Trans. Electron Devices, vol. 57, No. 7, pp. 1492-1496, 2010.

• K. -Y. Wong, W. Chen, X. Liu, C. Zhou, and K. J. Chen, "GaN Smart Power IC Technology," Phys. Sta. Sol. (b), 247, No. 7, pp. 1732-1734, 2010.

• M. J. Wang, C. C. Cheng, C. D. Beling, S. Fung, and K. J. Chen, "Modulation of polarization field by fluorine ions in AlGaN/GaN heterostructures revealed by positron annihilation spectroscopy," Phys. Sta. Sol. (a), 207, No. 6, pp. 1332-1334, 2010.

• Zhou, W. J. Chen, E. L. Piner, and K. J. Chen, "Schottky-Ohmic Drain AlGaN/GaN Normally-Off HEMT with Reverse Drain Blocking Capability," IEEE Electron Device Letters, vol. 31, No. 7, pp. 668-670, 2010.

• S. K. Jha, C. P. Liu, Z. H. Chen, K. J. Chen, I. Bello, J. A. Zapien, W. Zhang, and S.-T. Lee, "Integrated Nanorods and Heterostructure Field Effect Transistors for Gas Sensing," J. Phys. Chem. C, 114, pp. 7999-8004, 2010.  

• Q. Zhou, K. -Y. Wong, W. J. Chen, and K. J. Chen, "Wide-Dynamic-Range Zero-Bias Microwave Detector Using AlGaN/GaN Heterojunction Field-Effect Diode," IEEE Microwave and Wireless Components Letters, vol. 20, No. 5, pp. 277-279, 2010.

• K. -Y. Wong, W. J. Chen, and K. J. Chen, "Integrated Voltage Reference Generator for GaN Smart Power Chip Technology" IEEE Trans. Electron Devices, vol. 57, No. 4, pp. 952-955, Apr. 2010.

• C. H. Zhou, W. J. Chen, E. L. Piner, and K. J. Chen, "AlGaN/GaN lateral field-effect rectifier with intrinsic forward current limiting capability," Electronics Letters, vol. 46, No. 6, pp. 445-447, Mar. 2010.

• C. H. Zhou, W. J. Chen, E. L. Piner, and K. J. Chen, "AlGaN/GaN Dual-Channel Lateral Field-Effect Rectifier with Punch through Breakdown Immunity and Low On-Resistance," IEEE Electron Device Letters, vol. 31. No. 1, pp. 5-7, 2010.

2009:

• B. K. Li, M. J. Wang, K. J. Chen, and J. N. Wang, "Fermi-level depinning and hole injection induced two-dimensional electron related radiative emissions from a forward biased Ni/Au-AlGaN/GaN Schottky diode," Appl. Phys. Lett. 95, 232111, 2009.

• K. -Y. Wong, W. J. Chen, Q. Zhou, and K. J. Chen, "Zero-Bias Mixer Based on AlGaN/GaN Lateral Field-Effect diodes for High-Temperature Wireless Sensor and RFID Applications," IEEE Trans. Electron Devices, vol. 56, No. 12, pp. 2888-2894, Dec. 2009.

• J. Lv, Z. Yang, G. Z. Yan, Y. Cai, B. Zhang, and K. J. Chen, "Fabrication of Large-area Suspended MEMS Structures Using GaN-on-Si Platform," IEEE Electron Device Lett., vol. 30, No. 10, pp. 1045-1047, 2009.

• H. -Y. Huang, Z. -Y. Li, J. -Y. Lu, Z. -J. Wang, C. -S. Wang, K. M. Lau, K. J. Chen, and T. -Y. Zhang, "Microbridge tests on gallium nitride thin films," J. Micromech. Microeng., vol. 19, 095019, Sep. 2009.

• L. Yuan, M. Wang, and K. J. Chen, "On the stability of fluorine ions in AlGaN/GaN heterostructure: a molecular dynamics study," Phys. Sta. Sol. (c), vol. 6, No. S2, pp. S944-S947, June 2009.

• M. Wang, L. Yuan, F. Xu, B. Shen, and K. J. Chen, "Study of diffusion and thermal stability of fluorine ions in GaN by Time-of-Flight Secondary Ion Mass Spectroscopy," Phys. Sta. Sol. (c), vol. 6, No. S2, pp. S952-S955, June 2009.

• W. Chen, K. -Y. Wong, and K. J. Chen, "HEMT-compatible lateral field-effect rectifier using CF₄ plasma treatment," Phys. Sta. Sol. (c), vol. 6, No. S2, pp. S948-S951, June 2009.

• W. Chen, K. Y. Wong, and K. J. Chen, "Single-Chip Boost Converter using Monolithically Integrated AlGaN/GaN Lateral Field-Effect Rectifier and Normally-off HEMT,"IEEE Electron Device Lett., vol. 30, No. 5, pp. 430-432, 2009.

• M. J. Wang, L. Yuan, F. Xu, B. Shen, and K. J. Chen, "Diffusion mechanism and the thermal stability of fluorine ions in GaN after ion implantation," J. Appl. Phys., 105, 083519, 2009.

• H. Zhang and K. J. Chen, "Design of dual-band rat-race couplers," IET Microwave, Antenna and Propagation, vol. 3, No. 3 pp. 514-521, 2009.

• M. J. Wang, L. Yuan, C. Cheng, C. Beling, and K. J. Chen, "Defect formation and annealing behaviors of fluorine-implanted GaN layers revealed by positron annihilation spectroscopy", Appl. Phys. Lett., 94, 061910, 2009.

• X. Huo, G. -W. Xiao, P. C. H. Chan, and K. J. Chen, "Silicon-on-Organic Integration of a 2.4 GHz VCO using High-Q Copper Inductors and Solder-Bumped Flip Chip Technology," IEEE Trans. Components and Packaging Technology, vol. 32, No. 1, pp. 191-196, 2009.

• R. Wang, Y. Cai, and K. J. Chen, "Temperature Dependence and Thermal Stability of Planar-Integrated Enhancement/Depletion-mode AlGaN/GaN HEMTs and Digital Circuits", Solid State Electronics, 53, pp. 1-6, 2009.

2008:

• L. Yuan, M. J. Wang, and K. J. Chen, "Molecular dynamics calculation of the fluorine ions' potential energies in AlGaN/GaN Heterostructures," J. Appl. Phys., 104, 116106, 2008.

• W. Chen, K. Y. Wong, W. Huang, and K. J. Chen, "High-performance AlGaN/GaN lateral field-effect rectifiers compatible with high electron mobility transistors," Appl. Phys. Lett., vol. 92, 253501, 2008.

• (Invited article) B. K. Li, K. J. Chen, K. M. Lau, W. K. Ge, and J. N. Wang, "Characterization of fluorine-plasma-induced deep centers in AlGaN/GaN heterostructure by persistent photoconductivity," Phys. Stat. Sol. (c), vol. 5, No. 6, pp. 1892-1894, 2008

• R. Wang, Y. C. Wu, and K. J. Chen, "Gain Improvement of Enhancement-mode AlGaN/GaN HEMTs Using Dual-Gate Architectures," Jpn. J. Appl. Phys., Vol. 47, No. 4, pp. 2820-2823, 2008.

• S. K. Jha, C. Surya, K. J. Chen, K. M. Lau, and E. Jelencovic, "Low-frequency noise properties of double channel AlGaN/GaN HEMTs," Solid-State Electronics, 52, pp. 606-611, 2008.

• L. Yuan, M. J. Wang, and K. J. Chen, "Fluorine Plasma Ion Implantation in AlGaN/GaN Heterostructures: A Molecular Dynamics Simulation Study," Appl. Phys. Lett., 92, 102109, 2008.

• H. Zhang and K. J. Chen, "A Second-Order Dual-Band Bandpass Filter Using a Dual-Band Admittance Inverter," Microwave and Optical Technology Lett., vol. 50, No. 5, pp. 1184-1187, May 2008..

• J. W. Zhang, H. Zhang, S. G. Lu, Z. K. Xu, and K. J. Chen, "The Effect of Physical Design Parameters on the RF and Microwave Performance of the BST Thin Film Planar Interdigitated Varactors" Sensors and Actuators A: Physical, vol. 141, pp. 231-237, 2008.

• B. K. Li, W. Ge, J. N. Wang, and K. J. Chen, "Persistent photoconductivity and carrier transport in AlGaN/GaN heterostructures treated by fluorine plasma," Appl. Phys. Lett. 92, 082105, 2008.

2007:

• X. Wang, B. Z. Wang, H. Zhang, and K. J. Chen, "A Tunable Bandstop Resonator Based on a Compact Slotted Ground Structure," IEEE Trans. Microwave Theory and Techniques, vol. 55, No. 9, pp. 1912-1918, Sep. 2007.

• R. Wang, Y. Cai, W. C. -W. Tang, K. M. Lau, and K. J. Chen, "Integration of Enhancement and Depletion-mode AlGaN/GaN MIS-HFETs by Fluoride-based Plasma Treatment," Phys. Stat. Sol. (a), No. 6, 2023-2027, June 2007.

• K. -Y. Wong, W. Tang, K. M. Lau, and K. J. Chen, "Surface Acoustic Wave Device on AlGaN/GaN Heterostructure Using Two-Dimensional Electron Gas Interdigital Transducers," Appl. Phys. Lett., vol. 90, 213506, May 2007.

• Z. Cheng, Y. Cai, J. Liu, Y. G. Zhou, K. M. Lau, and K. J. Chen, "1.9-GHz Low Noise Amplifier Using High-Linearity and Low-Noise Composite-Channel HEMTs," Microwave and Optical Technology Lett., vol. 49, No. 6, pp. 1360-1362, June 2007.

• Y, Cai, Z. Cheng, Z. Yang, W. C. -W. Tang, K. M. Lau, and K. J. Chen, "High Temperature Operation of AlGaN/GaN HEMTs Direct-Coupled FET Logic (DCFL) Integrated Circuits," IEEE Electron Device Lett., vol. 28, No. 5, pp. 328-331, May, 2007.

• R. Wang, Y.Cai, W. C. -W. Tang, K. M. Lau, and K. J. Chen, "Device Isolation by Plasma Treatment for Planar Integration of Enhancement/Depletion-Mode AlGaN/GaN High Electron Mobility Transistors,"  Jpn J. Appl. Phys, vol. 46, No. 4B, pp. 2330-2333, 2007.

• D. Song, J. Liu, Z. Cheng, W. C. -W. Tang, K. M. Lau, and K. J. Chen, "Normally Off AlGaN/GaN Low-Density Drain HEMT (LDD-HEMT) With Enhanced Breakdown Voltage and Reduced Current Collapse," IEEE Electron Device Lett., vol. 28, No. 3, pp. 189-191, Mar. 2007.

• H. Zhang and K. J. Chen, "A Stub Tapped Branch-Line Coupler for Dual-Band Operations," IEEE Microwave and Wireless Components Lett. , vol. 17, No. 2, pp. 106-108, Feb. 2007.

• Z. Cheng, Y. Cai, J. Liu, Y. G. Zhou, K. M. Lau, and K. J. Chen, "A Low Phase-Noise X-Band MMIC VCO Using High-Linearity and Low-Noise Composite-Channel Al_0.3Ga_0.7N/Al_0.05Ga_0.95N/GaN  HEMTs", IEEE Trans. Microwave Theory and Techniques, vol. 55, No. 1, pp. 23-29, Jan 2007.

• J. Liu, Y. Zhou, J. Zhu, Y. Cai, K. M. Lau, and K. J. Chen, "DC and RF Characteristics of AlGaN/GaN/InGaN/GaN Double-Heterojunction HEMTs," IEEE Trans. Electron Devices, vol.. 54, No. 1, pp. 2-10, Jan. 2007.

2006:

• X. Huo, P. C. H. Chan, K. J. Chen, and H. Luong, "A Physical Model for On-Chip Spiral Inductors with Accurate Substrate Modeling," IEEE Trans. Electron Devices, vol. 53, No. 12, pp. 2942-2949, Dec. 2006.

• R. Wang, Y. Cai, C. -W. Tang, K. M. Lau, and K. J. Chen, "Enhancement-Mode Si₃N₄/AlGaN/GaN MISHFETs," IEEE Electron Device Letters, vol. 27, No. 10, pp. 793-795, Oct. 2006.

• Y. Cai, Y. G. Zhou, K. M. Lau, and K. J. Chen, "Control of Threshold Voltage of AlGaN/GaN HEMTs by Fluoride-based Plasma Treatment: From Depletion Mode to Enhancemend Mode," IEEE Trans. Electron Devices, vol. 53, No. 9, pp. 2207-2215, Sep. 2006.

• Y. Cai, Z. Cheng, W. C. K. Tang, K. M. Lau, and K. J. Chen, "Monolithically Integrated Enhancement/Depletion-Mode AlGaN/GaN HEMT Inverters and Ring Oscillators Using CF₄ Plasma Treatment," IEEE Trans. Electron Devices, vol. 53, No. 9, pp. 2223-2230, Sep. 2006.

• R. Wang, Y. Cai, W. Tang, K. M. Lau, and K. J. Chen, "Planar Integration of E/D-Mode AlGaN/GaN HEMTs Using Fluoride-Based Plasma Treatment," IEEE Electron Device Letters, vol. 27, No. 8, pp. 633-635, Aug. 2006.

• L. L. W. Leung, J. -W. Zhang, W. C. Hon, and K. J. Chen, "Characterization and Attenuation Mechanisms of CMOS Compatible Micromachined Edge-suspended Coplanar Waveguides on Low-resistivity Silicon Substrate," IEEE Trans. Advanced Packaging, vol. 29, No. 3, pp. 496-503, Aug. 2006.

• Z. Yang, R. Wang, D. Wang, B. Zhang. K. M. Lau, and K. J. Chen, "GaN on Patterned Silicon (GPS) Technique for GaN-based MEMS," Sensors and Actuators A: Physical, vol. 130-131, pp. 371-378, Aug. 2006.

• Y. Cai, Y. G. Zhou, K. M. Lau, and K. J. Chen "Enhancement-Mode AlGaN/GaN HEMTs with Low On-Resistance and Low Knee-Voltage," IEICE Trans. on Electronics, vol. E89-C, No. 7, 1025-1030, July, 2006.

• S. Jia, Y. Cai, D. Wang, B. Zhang, K. M. Lau, and K. J. Chen "Enhancement-Mode AlGaN/GaN HEMTs on Silicon Substrate," IEEE Trans. on Electron Devices, vol. 53, No. 6, pp. 1474-1477, June, 2006.

• J. Liu, Y. G. Zhou, J. Zhu, K. M. Lau, and K. J. Chen, "AlGaN/GaN/InGaN/GaN HEMTs with an InGaN-notch," Phys. Stat. Sol. (c), vol. 3, No. 6, pp. 2312-2316, 2006.

• Z. Yang, R. N. Wang, S. Jia, D. Wang, B. S. Zhang, K. M. Lau, and K. J. Chen "Fabrication of suspended GaN microstructures using GaN-on-patterned-silicon (GPS) technique," Phys. Stat. Sol. (a), vol. 203, No. 7, pp. 1721-1724, May 2006.

• L. L. W. Leung and K. J. Chen, "CAD Equivalent Circuit Modeling of Attenuation and Cross-Coupling for Edge-Suspended Coplanar Waveguides on Lossy Silicon Substrate," IEEE Trans. Microwave Theory and Techniques, vol. 54, No. 5, pp. 2249-2255, May 2006.

• H. Zhang and K. J. Chen, "Bandpass Filters with Reconfigurable Transmission Zeros Using Varactor-Tuned Tapped Stubs," IEEE Microwave and Wireless Components Lett.,vol. 16, No. 5, pp. 249-251, May 2006.

• S. Jia, Y. Cai, D. Wang, B. Zhang, K. M. Lau, and K. J. Chen "Enhancement-Mode AlGaN/GaN High Electron Mobility Transistors on Silicon Substrate," Phys. Sta. Sol. (c) , vol. 3, pp. 2368-2372, 2006.

• Z. Feng, S. J. Cai, K. J. Chen, and K. M. Lau, "Isoelectronic Indium Surfactant-doped AlGaN/GaN High Electron Mobility Transistors," Appl. Phys. Lett., vol. 88, 122113, 2006.

• H. Zhang and K. J. Chen, "Miniaturized Coplanar Waveguide Bandpass Filters Using Multi-Section Stepped Impedance Resonators," IEEE Trans. Microwave Theory and Techniques, vol. 54, No. 3, pp. 1090-1095, 2006.

• Z. Yang, R. Wang, D. Wang, B. Zhang. K. M. Lau, and K. J. Chen, "Mechanical Characterization of Suspended GaN Microstructures by GaN-on-Patterned-Silicon Technique," Appl. Phys. Lett., vol. 88, 041913, 2006.

• J. Liu, Y. G. Zhou, J. Zhu, K. M. Lau, and K. J. Chen, "AlGaN/GaN/InGaN/GaN Double Heterojunction HEMTs with an InGaN-Notch for Enhanced Carrier Confinement," IEEE Electron Device Letters, vol. 27, No.1, pp. 10-12, 2006.

2005:

• Z. Feng, S. J. Cai, K. J. Chen, and K. M. Lau, "Enhanced-Performance of AlGaN-GaN HEMTs Grown on Grooved Sapphire Substrates," IEEE Electron Device Letters, vol. 26, No. 12, pp. 870-872, Dec. 2005.

• L. L. W. Leung and K. J. Chen, "Microwave Characterization and Modeling of High Aspect Ratio Through-Wafer Interconnect Vias in Silicon substrates," IEEE Trans. on Microwave Theory and Techniques,, vol. 53, No. 8, pp. 2472-2480, Aug. 2005.

• Z. Cheng, J. Liu, Y. G. Zhou, Y. Cai, K. J. Chen, and K. M. Lau, "Broadband Microwave Noise Characteristics of High-Linearity Composite-Channel Al_0.3Ga_0.7N/Al_0.05Ga_0.95N/GaN HEMTs," IEEE Electron Device Letters, vol. 26,No. 8, pp. 521-523, Aug. 2005.

• Y. Cai, Y. G. Zhou, K. J. Chen, and K. M. Lau, "High-Performance Enhancement-Mode AlGaN/GaN HEMTs using Fluoride-based Plasma Treatment," IEEE Electron Device Letters, vol. 26, No. 7, pp. 435-437, 2005.

• S. Chu, Y. G. Zhou, K. J. Chen, and K. M. Lau, "Q-Factor Characterization of Radio-Frequency GaN-based Metal-Semiconductor-Metal Planar Inter-Digitated Varactors," IEEE Electron Device Letters, vol. 26, No. 7, pp. 432-434, 2005.

• H. Zhang and K. J. Chen, "A Tri-Section Stepped-Impedance Resonator for Cross-Coupled Bandpass Filters," IEEE Microwave and Wireless Components Letters, vol. 15, No. 6, pp. 401-403, June, 2005.

• R. M. Chu, Y. G. Zhou, J. Liu, D. Wang, K. J. Chen, and K. M. Lau, "AlGaN-GaN Double-Channel HEMTs," IEEE Trans. Electron Devices, vol. 52, No. 4, pp. 438-446, Apr. 2005. 

• Y. G. Zhou, R. M. Chu, J. Liu, K. J. Chen, and K. M. Lau, "Gate leakage in AlGaN/GaN HEMTs and its suppression by optimization of MOCVD growth," Phys. Sta. Sol. (c), vol. 2, No. 7, pp. 2663-2667, 2005.

• J. Liu, Y. G. Zhou, R. M. Chu, Y. Cai, K. J. Chen, and K. M. Lau, "Highly Linear Al_0.3Ga_0.7N/Al_0.05Ga_0.95N/GaN Composite-Channel HEMTs," IEEE Electron Device Letters, vol. 26, No. 3, pp. 145-147, Mar. 2005.

• S. Jia, Y. Dikme, D. Wang, K. J. Chen, K. M. Lau, and M. Heuken, "AlGaN-GaN HEMTs on Patterned Silicon (111) Substrate," IEEE Electron Device Letters, vol. 26, No. 3, pp. 130-132, Mar. 2005.

• D. Wang, S. Jia, K. J. Chen, K. M. Lau, Y. Dikme, P. van Gemmern, Y. C. Lin, M. Heuken, and R. H. Jansen, "Micro-Raman Scattering Study of the Stress Distribution in GaN films grown on patterned Si(111) substrate using metalorganic vapor deposition," Journal of Applied Physics, vol. 97, 056103, Mar. 2005.

• J. W. Zhang, W. C. Hon, L. L. W. Leung, and K. J. Chen, "CMOS-Compatible Micromachining Techniques for Fabricating High-Performance Edge-suspended RF/Microwave Passive Components on Silicon Substrates," Journal Of Micromechanics and Microengineering, vol. 15, No. 2, pp. 328-335, Feb. 2005.

• Y. Cai, Y. G. Zhou, and K. J. Chen, and K. M. Lau, "III-Nitride Metal-Insulator-Semiconductor Heterojunction Field-Effect Transistors Using Sputtered AlON Thin Films,"Appl. Phys. Lett., vol. 86, No. 3, 032109, Jan. 2005.

• Y. G. Zhou, D. Wang, R. M. Chu, C. -W. Tang, Y. Qi, Z. Lu, K. J. Chen, and K. M. Lau, "Correclation of In-situ Reflectance Spectrum and Resistivity of GaN/Al₂O₃ Interfacial Layer in Metalorganic Chemical Vapor Deposition," IEEE/TMS Journal of Electronic Materials, vol. 34, pp. 112-118, Jan. 2005.

2004:

• Wang, Y. Dikme, S. Jia, K. J. Chen, K. M. Lau, P. van Gemmern, Y. C. Lin, H. Kalisch, R. H. Jansen, and M. Heuken, "Characterization of GaN grown on patterned Si(111) substrate," Journal of Crystal Growth, vol. 272, pp. 489-495, Dec. 2004.

• T. Suligoj, H. Liu, J. K. O. Sin, K. Tsui, R. M. Chu, K. J. Chen, P. Biljanovic, and K. L. Wang, "A Low-Cost Horizontal Current Bipolar Transistor (HCBT) Technology for the BiCMOS Integration with FinFETs," Solid-State Electronics, vol. 48, pp. 2047-2050, Nov. 2004.

• K. J. Chen, K. W. Chan, M. K. W. Wong, N. M. K. Fok, N. C. H. Fan, "High-Performance Large-Inductance Embedded Inductors in Thin Array Plastic Packaging (TAPP) for RF System-in-Package Applications," IEEE Microwave and Wireless Components Letters,, vol. 14, No. 9, pp. 449-451, Sep. 2004.

• L. L. W. Leung, W. C. Hon, and K. J. Chen, "Low-loss Coplanar Waveguides Interconnects on Low-resistivity Silicon Substrate," IEEE Trans. on Components and Packaging Technologies,, vol. 27, No. 3, pp. 507-512, Sep. 2004.

• K. J. Chen, W. C. Hon, J. -W. Zhang, and L. L. W. Leung,  "CMOS-Compatible Micromachined Edge-suspended Inductors with High Q-factors and Self-resonance Frequencies," IEEE Electron Device Letters,, vol. 25, No. 6, pp. 363-365, June, 2004.

• L. L. W. Leung, K. J. Chen, X. Huo, and P. C. H. Chan, "Low-loss Microwave Filter on CMOS-grade Standard Silicon Substrate with a Low-k BCB Dielectric," Microwave and Optical Technology Letters, vol. 40, No. 1, pp. 9-11, Jan. 2004.

2003:

• R. M. Chu, Y. G. Zhou, K. J. Chen, and K. M. Lau, "Admittance Characterization and Analysis of Trap States in AlGaN/GaN Heterostructures," Phys. Sta. Sol.(c) , No. 7, pp. 2400-2403, Oct. 2003.

• K. Tsui, K. J. Chen, S. Lam, and M. Chan, "0.5-um Silicon-on-Sapphire Metal Oxide Semiconductor Field Effect Transistor for RF Power Amplifier Application," Jpn. J. Appl. Phys., vol. 42, Part 1, No. 8, pp. 4982-4986, Aug. 2003.

• K. J. Chen, G. F. Niu, "Logic Synthesis and Circuit Modeling of a Programmable Logic Gate based on Controlled Quenching of Series-Connected Negative Differential Resistance Devices," IEEE J. Solid-State Circuits, vol. 38, No. 2, pp. 312-318, Feb. 2003.

Recent Conference Papers (2003-present)

2017:

• M. Hua, J. Wei, Q. Bao, J. He, Z. Zhang, Z. Zheng, J. Lei, and K. J. Chen, "Reverse-Bias Stability and Reliability of Hole-Barrier-Free E-mode LPCVD-SiNx/GaN MIS-FETs," 2017 Int. Electron Device Meeting (IEDM 2017), San Francisco, CA, USA, Dec. 4-6, 2017.
• J. Lei, J. Wei, G. Tang, Q. Qian, M. Hua, Z. Zhang, Z. Zheng, and K. J. Chen, "An Interdigitated GaN MIS-HEMT/SBD Normally-Off Power Switching Device with Low ON-resistance and Low Reverse Conduction Loss," 2017 Int. Electron Device Meeting (IEDM 2017), San Francisco, CA, USA, Dec. 4-6, 2017.
• R. Xie, G. Xu, X. Yang, H. Wang, M. Tian, Y. Tian, F. Zhang, W. Chen, L. Wang, and K. J. Chen, "Switching Transient Analysis for Normally-off GaN Transistors with p-GaN Gate in a Phase-leg Circuit" in Proc. Energy Conversion Congress and Exposition (ECCE), Cincinnati, OH, USA, 2017.
• Q. Qian, Z. Zhang, M. Hua, J. Wei, J. Lei, and K. J. Chen, “Low-Resistance Contact to Single-Layer MoS₂ by Depositing Ultrathin High-k Dielectric with Remote N₂ Plasma Treatment as Tunneling Layer,”2017 International Conference on Solid State Device and Materials (SSDM 2017) Sendai, Japan, Sep. 19-21, 2017.
• G. Tang, J. Wei, Z. Zhang, M. Hua, X. Tang, H. Wang, and K. J. Chen, “Characterization and Analysis of Dynamic Ron of GaN-on-Si lateral Power Devices with Grounded and Floating Si Substrate,” 12^th Int. Conf. on Nitride Semiconductors (ICNS-12), Strasbourg, France, July. 24- 28, 2017.
• J. He, M. Hua, G. Tang, Z. Zhang, and K. J. Chen, “Comparison of E-mode Fully recessed GaN MIS-FETs and Partially-recessed MIS-HEMTs with PECVD-SiNx/LPCVD-SiNx Gate Stack,” 12^th Int. Conf. on Nitride Semiconductors (ICNS-12), Strasbourg, France, July. 24- 28, 2017.
• M. Hua, Q. Qian, J. Wei, Z. Zhang, G. Tang, and K. J. Chen, “PBTI and NBTI of Fully-recessed E-mode LPCVD-SiNx/GaN MIS-FETs with PECVD-SiNx Interfacial Protection Layer,”12^th Int. Conf. on Nitride Semiconductors (ICNS-12), Strasbourg, France, July. 24- 28, 2017.
• Q. Bao, Y. Li, Z. Zhang, Q. Qian, J. Lei, G. Tang, B. Huang and K. J. Chen, “Effective Cross-Plane Thermal Conductivity of GaN-on-Si (111) Epi-layers Evaluated by 3-Omega Technique,” 12^th Int. Conf. on Nitride Semiconductors (ICNS-12), Strasbourg, France, July. 24- 28, 2017.
• G. Tang, H. Wang, J. Lei, and K. J. Chen, “Monolithic Intergration of E/D-Mode HEMTs for Logic Circuit on the p-GaN Gate Technology Platform,” 12^th Int. Conf. on Nitride Semiconductors (ICNS-12), Strasbourg, France, July. 24- 28, 2017.
• M. Hua, Q. Qian, J. Wei, Z. Zhang, G. Tang, and K. J. Chen, "TDDB and PBTI Characterizations of Fully-recessed E-mode GaN MIS-FETs with LPCVD-SiN_x/PECVD-SiN_x Gate Dielectric Stack," 2017 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH 2017) Indian Wells. CA, USA, May 22-26, 2017.
• M. Hua, Z. Zhang, Q. Qian, J. Wei, Q. Bao, G. Tang, and K. J. Chen, "High-Performance Fully-recessed Enhancement Mode GaN MIS-FETs with Crystalline Oxide Interlayer," 2017 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'17), Sapporo, Japan, May 28- June 1, 2017. (Charitat Award: for the best Young Researcher)
• G. Tang, J. Wei, Z. Zhang, X. Tang, M. Hua, H. Wang, and K. J. Chen, "Impact of substrate termination on dynamic performance of GaN-on-Si lateral power devices," 2017 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'17), Sapporo, Japan, May 28- June 1, 2017.
• J. Wei, Y. Wang, M. Zhang, H. Jiang, and K. J. Chen, "High-speed power MOSFET with low reverse transfer capacitance using a trench/planar gate architecture," 2017 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'17), Sapporo, Japan, May 28- June 1, 2017.
• J. Wei, M. Zhang, H. Jiang, H. Wang, and K. J. Chen, "Charge storage effect in SiC trench MOSFET with a floating p-shield and its impact on dynamic performances," 2017 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'17), Sapporo, Japan, May 28- June 1, 2017.
• S. Yang, C. Zhou, S. Han, K. Sheng, and K. J. Chen, "Buffer Trapping-Induced RON Degradation in GaN- on-Si Power Transistors: Role of Electron Injection from Si Substrate,".2017 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'17), Sapporo, Japan, May 28- June 1, 2017.

2016:

• Z. Zhang, B. Li, X. Tang, Q. Qian, M. Hua, B. Huang, and K. J. Chen, " First-Principles Study of GaN Surface Electronic Structures with Ga, O or N Adatom," 47th IEEE Semiconductor Interface Specialists Conference (SISC), San Diego, CA, USA, Dec. 8-10, 2016.
• Z. Zhang, B. Li, X. Tang, Q. Qian, M. Hua, B. Huang, and K. J. Chen, "Nitridation of GaN Surface for Power Device Application: A First-Principles Study," 2016 Int. Electron Device Meeting (IEDM 2016), San Francisco, CA, USA, Dec. 5-7, 2016.
• M. Hua, Z. Zhang, J. Wei, J. Lei, G. Tang, K. Fu, Y. Cai, B. Zhang, and K. J. Chen, "Integration of LPCVD-SiN_x Gate Dielectric with Recessed-gate E-mode GaN MIS-FETs: Toward High Performance, High Stability and Long TDDB Lifetime," 2016 Int. Electron Device Meeting (IEDM 2016), San Francisco, CA, USA, Dec. 5-7, 2016.
• S. Yang, Z. Tang, Y. Lu, Q. Jiang, and A. Zhang, "Role of shallow surface traps and polarization charges in nitride-based passivation for AlGaN/GaN heterojunction FET," IFWS 2016, Beijing, China, Nov. 15-17, 2016.
• B. Li, X. Tang, J. Wang, and K. J. Chen, "Enhancing Dynamic Performance of Gan-on-Si Power Devices With on-chip Photon Pumping," 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT 2016) Hangzhou, China, Oct. 25-28, 2016.
• H. Wang, R. Xie, C. Liu, J. Wei, G. Tang, and K. J. Chen, " Maximizing the Performance of 650 V p-GaN Gate HEMTs: Dynamic R_ON Characterization and Gate-Drive Design Considerations, " 2016 IEEE Energy Conversion Cong. and Expo. (ECCE), Milwaukee, WI, USA, Sept. 18-22, 2016.
• R. Xie, H. Wang, G. Tang, X. Yang, and K. J. Chen, " An Analytical Model for False Turn-On Evaluation of GaN Transistor in Bridge-Leg Configuration, " 2016 IEEE Energy Conversion Cong. and Expo. (ECCE), Milwaukee, WI, USA, Sept. 18-22, 2016.
• S. Yang, S. Liu, C. Liu, M. Hua, G. Longobardi, F. Udrea, and K. J. Chen, " Performance Enhancement and Characterization Techniques for GaN Power Devices, " 2016 Compound Semiconductor Week (CSW 2016), Toyama, Japan, June 26-30, 2016.
• J. Wei, S. Liu, B. Li, X. Tang, Z. Zhang, G. Tang, and K. J. Chen, " Critical Heterostructure Design for Low On-Resistance Normally-Off Double-Channel MOS-HEMT, " 2016 Compound Semiconductor Week (CSW 2016), Toyama, Japan, June 26-30, 2016.
• S. Yang, Y. Lu, S. Liu, H. Wang, C. Liu, and K. J. Chen, "Impact of V_TH Shift on R_ON in E/D-Mode GaN-on-Si Power Transistors: Role of Dynamic Stress and Gate Overdrive, " 2016 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'16), Prague, Czech Republic, Jun. 12-16, 2016.
• X. Tang, B. Li, H. Wang, J. Wei, G. Tang, Z. Zhang, and K. J. Chen, "Impact of Integrated Photonic-Ohmic Drain on Static and Dynamic Characteristics of GaN-on-Si Heterojunction Power Transistors, " 2016 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'16), Prague, Czech Republic, Jun. 12-16, 2016.
• J. Wei, H. Jiang, Q. Jiang, and K. J. Chen, "Proposal of a Novel GaN/SiC Hybrid FET (HyFET) with Enhanced Performance for High-Voltage Switching Applications, " 2016 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'16), Prague, Czech Republic, Jun. 12-16, 2016.
• S. Yang, L. Lei, K. Yu, A. Zhang, and K. J. Chen, " Comparison of SiN_x and AlN Passivations for AlGaN/GaN HEMTs, " 229^th ECS Meeting, San Diego, USA, May 29-Jun. 2, 2016.

· M. Hua, Y. Lu, S. Liu, C. Liu, K. Fu, Y. Cai, B. Zhang, and K. J. Chen, "Compatibility of AlN/SiN_x Passivation with High-Temperature Process," CS MANTECH Conference, Hyatt Regency Miami, Florida, USA, May 16-19, 2016.

2015:

• X. Tang, B. Li, Y. Lu, H. Wang, C. Liu, J. Wei, and K. J. Chen, "III-Nitride Transistors with Photonic-Ohmic Drain for Enhanced Dynamic Performances, " 2015 Int. Electron Device Meeting (IEDM 2015), Washington, DC, USA, Dec. 7-9, 2015.
• J. Wei, S. Liu, B. Li, X. Tang, Y. Lu, C. Liu, M. Hua, Z. Zhang, G. Tang, and K. J. Chen, "Enhancement-mode GaN Double-Channel MOS-HEMT with Low On-resistance and Robust Gate Recess, " 2015 Int. Electron Device Meeting (IEDM 2015), Washington, DC, USA, Dec. 7-9, 2015.
• (Invited) K. J. Chen, B. Li, X. Tang, and J. Wang, "Optoelectronic Devices on AlGaN/GaN HEMT Platform, " 11^th Int. Conf. on Nitride Semiconductors (ICNS-11), Beijing, China, Aug. 30- Sept. 4, 2015.
• M. Hua, C. Liu, S. Yang, S. Liu, K. Fu, Z. Dong, Y. Cai, B. Zhang, and K. J. Chen, "Gate Leakage and Time-Dependent Dielectric Breakdown Characteristics of LPCVD-SiN_x/AlGaN/GaN MIS-HEMTs, " 11^th Int. Conf. on Nitride Semiconductors (ICNS-11), Beijing, China, Aug. 30- Sept. 4, 2015.
• X. Tang, Q. Jiang, H. Wang, B. Li, and K. J. Chen, "Suppressed Substrate-Coupled Cross-Talk under AC High-Voltage Switching on the AlGaN/GaN-on-Si Smart Power IC Platform, " 11^th Int. Conf. on Nitride Semiconductors (ICNS-11), Beijing, China, Aug. 30- Sept. 4, 2015.
• S. Yang, Z. Tang, Y. Lu, A. Zhang, and K. J. Chen, "Differences between SiN_x and AlN Passivations for AlGaN/GaN HEMTs: A Tcad-Simulation Based Study, " 11^th Int. Conf. on Nitride Semiconductors (ICNS-11), Beijing, China, Aug. 30- Sept. 4, 2015.
• S. Liu, S. Yang, C. Liu, Y. Lu and K. J. Chen, "High-Performance Gate-Recessed Normally-Off GaN MIS-HEMTs with Thin Barrier Layer," 11^th Int. Conf. on Nitride Semiconductors (ICNS-11), Beijing, China, Aug. 30- Sept. 4, 2015.
• H. Wang, C. Liu, Q. Jiang, Z. Tang, and K. J. Chen, "Hard Switching Characteristics of AlN-Passivated AlGaN/GaN on silicon MIS-HEMTs," 11^th Int. Conf. on Nitride Semiconductors (ICNS-11), Beijing, China, Aug. 30- Sept. 4, 2015.
• C. Liu, J. Wei, S. Liu, H. Wang, Z. Tang, S. Yang and K. J. Chen, "Improved High-Voltage Performance of Normally-Off GaN MIS-HEMTs Using Fluorine implanted Enhanced Back Barrier, " 11^th Int. Conf. on Nitride Semiconductors (ICNS-11), Beijing, China, Aug. 30- Sept. 4, 2015.
• X. Tang, B. Li, Y. Lu, and K. J. Chen, "On-Chip Addressable Schottky-on-Heterojunction Light-Emitting Diode Arrays on AlGaN/GaN-On-Si Platform, " 11^th Int. Conf. on Nitride Semiconductors (ICNS-11), Beijing, China, Aug. 30- Sept. 4, 2015.
• S. Lin, M. Wang, B. Xie, C. P. Wen, Min Yu, J. Wang, Y. Hao, W. Wu, B. Shen, and K. J. Chen, " Reduction of the Current Collapse in GaN High Electron Mobility Transistors by a Novel Surface Treatment," 11^th Int. Conf. on Nitride Semiconductors (ICNS-11), Beijing, China, Aug. 30- Sept. 4, 2015.
• L. Yuan, X. Xiao, L. Tang, H. Li, Y. Jiang, K. J. Chen and A. Yen, " First Demonstration of 0.27-Ω 600-V/10-A GaN-on-Si Power MIS-HEMTs in a 200-mm Hybrid CMOS-/Au-Compatible Process Line," 11^th Int. Conf. on Nitride Semiconductors (ICNS-11), Beijing, China, Aug. 30- Sept. 4, 2015.
• (Invited) S. Yang, S. Liu, C. Liu, Y. Lu, and K. J. Chen, " Nitridation interfacial-layer technology for enhanced stability in GaN-based power devices, " 2015 IEEE International Symposium on Radio-Frequency Integration Technology(RFIT 2015), Sendai, Japan, Aug. 26-28, 2015.
• (Keynote speach) K. J. Chen, "Technology Challenges of GaN Heterojunction Power Devices," The 7th Asia-Pacific Workshop on Widegap Semiconductors (APWS 2015), Seoul, Korea, May 17-20, 2015.
• X. Tang, B. Li, and K. J. Chen, "Accelerated Electron De-trapping in AlGaN/GaN-on-Si Power HEMTs using Schottky-on-Heterojunction Light Emitting Devices, " 2015 Compound Semiconductor Week (CSW 2015), University of California Santa Barbara, CA, USA, June 28-July 2, 2015.
• C. Liu, H. Wang, S. Yang, Y. Lu, S. Liu, Z. Tang, Q. Jiang, and K. J. Chen, "Improved Thermal Stabilities in Normally-off GaN MIS-HEMTs, " CS MANTECH Conference, Scottsdale, Arizona, USA, May 18-21, 2015.
• C. Liu, H. Wang, S. Yang, Y. Lu, S. Liu, Z. Tang, Q. Jiang, S. Huang, and K. J. Chen, "Normally-off GaN MIS-HEMT with Improved Thermal Stability in DC and Dynamic Performance, " 2015 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'15), Hong Kong, China, May 10-14, 2015.
• M. Hua, C. Liu, S. Yang, S. Liu, Y. Lu, K. Fu, Z. Dong, Y. Cai, B. Zhang, and K. J. Chen, "650-V GaN-Based MIS-HEMTs Using LPCVD-SiN_x as Passivation and Gate Dielectric, " 2015 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'15), Hong Kong, China, May 10-14, 2015.
• X. Tang, B. Li, and K. J. Chen, "On-chip Optical Pumping of Deep Traps in AlGaN/GaN-on-Si Power HEMTs," 2015 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'15), Hong Kong, China, May 10-14, 2015.

2014:

• S. Yang, S. Liu, C. Liu, Z. Tang, Y. Lu, and K. J. Chen, "Thermally Induced Threshold Voltage Instability of III-Nitride MIS-HEMTs and MOSC-HEMTs : Underlying Mechanisms and Optimization Schemes," 2014 Int. Electron Device Meeting (IEDM 2014), San Francisco, CA, USA, Dec. 15-17, 2014.
• B. Li, X. Tang, Q. Jiang, Y. Lu, H. Wang, J. Wang, and K. J. Chen, "Schottky-on-Heterojunction Optoelectronic Functional Devices Realized on AlGaN / GaN-on-Si Platform," 2014 Int. Electron Device Meeting (IEDM 2014), San Francisco, CA, USA, Dec. 15-17, 2014.
• S. Huang, Q. Jiang, K. Wei, G. Liu, J. Zhang, X. Wang, Y. Zheng, B. Sun, C. Zhao, H. Liu, Z. Jin, X. Liu, H. Wang, S. Liu, Y. Lu, C. Liu, S. Yang, Z. Tang, J. Zhang, Y. Hao, and K. J. Chen, "High-Temperature Low-Damage Gate Recess Technique and Ozone-Assisted ALD-grown Al₂O₃ Gate Dielectric for High-Performance Normally-Off GaN MIS-HEMTs, "2014 Int. Electron Device Meeting (IEDM 2014), San Francisco, CA, USA, Dec. 15-17, 2014.
• (Invited) K. J. Chen, S. Yang, Z. Tang, and S. Huang, "Dielectric/III-N interfaces with nitridation interfacial-layer for GaN power electronics," 45th IEEE Semiconductor Interface Specialists Conference (SISC), San Diego, USA, Dec. 10-13, 2014.
• S. Yang, and K. J. Chen, "Nitridation Interfacial-Layer Technology: Enabling Low Interface Trap Density and High Stability in III-Nitride MIS-HEMTs," 12th International Conferences on Solid-State and Integrated Circuit Technology (ICSICT2014), Guilin, China, Oct. 28-31, 2014.
• (Invited) K. J. Chen, S. Yang, Z. Tang, S. Huang, Y. Lu, Q. Jiang, S. Liu, C. Liu, and B. Li, "Surface Nitridation for Improved Dielectric/III−Nitride Interfaces in GaN MIS−HEMTs," 8th International Workshop on Nitride Semiconductors (IWN 2014), Wrocław, Poland, August 24-29, 2014.
• S. Liu, S. Yang, Z. Tang, Q. Jiang, C. Liu, M. Wang, and K. J. Chen, "Interface Characterization of Normally−Off Al₂O₃/AlN/GaN MOS−Channel− HEMTs with an AlN Interfacial Layer," 8th International Workshop on Nitride Semiconductors (IWN 2014), Wrocław, Poland, August 24-29, 2014.
• Y. Lu, B. Li, X. Tang, Q. Jiang, S. Yang, Z. Tang, and K. J. Chen, "Investigation of Gate Degradation in Al₂O₃−AlGaN/GaN MIS−HEMTs using Transparent Gate Electrode," 8th International Workshop on Nitride Semiconductors (IWN 2014), Wrocław, Poland, August 24-29, 2014.
• H. Wang, A. M. H. Kwan, Q. Jiang, and K. J. Chen, "A GaN Pulse Width Modulation Integrated Circuit," 2014 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'14), Waikoloa, Hawaii, USA, June 15-19, 2014.
• S. Liu, S. Yang, Z. Tang, Q. Jiang, C. Liu, M. Wang, and K. J. Chen, "Performance Enhancement of Normally-Off Al₂O₃/AlN/GaN MOS-Channel-HEMTs with an ALD- Grown AlN Interfacial Layer," 2014 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'14), Waikoloa, Hawaii, USA, June 15-19, 2014.
• M. Wang, Y. Wang, C. Zhang, C. P. Wen, J. Wang, Y. Hao, W. Wu, B. Shen, and K. J. Chen, "Normally-Off Hybrid Al₂O₃/GaN MOSFET on Silicon Substrate Based on Wet-Etching," 2014 International Symposium on Power Semiconductor Devices and ICs (ISPSD'14), Waikoloa, Hawaii, USA, June 15-June19, 2014.
• Z. Tang, S. Huang, and K. J. Chen, "Stability and Temperature Dependence of Dynamic R_ON in AlN-Passivated AlGaN/GaN HEMT on Si Substrate," CS MANTECH Conference, Denver, Colorado, USA, May 19-22, 2014. (Best student paper award)
• A. Zhang, L. Zhang, Z. Tang, X. Cheng, Y. Wang, K. J. Chen, and M. Chan, "Analytical Modeling for AlGaN/GaN HEMTs," The 11th International Workshop on Compact Modeling (IWCM 2014), Singapore, Jan. 23, 2014.

2013:

• S. Yang, Z. Tang, K. Wong, Y. Lin, S. Huang, and K. J. Chen, "Mapping of interface traps in high-performance Al₂O₃/AlGaN/GaN MIS-heterostructures using frequency- and temperature-dependent C-V techniques," 2013 Int. Electron Device Meeting (IEDM 2013), Washington, DC, USA, Dec. 9-11, 2013.
• Z. Tang, Q. Jiang, S. Huang, Y. Lu, S. Yang, C. Liu, X. Tang, S. Liu, B. Li, and K. J. Chen, "Monolithically Integrated 600-V E/D-Mode SiNx/AlGaN/GaN MIS-HEMTs and Their Applications in Low-Standby-Power Start-Up Circuit for Switched-Mode Power Supplies," 2013 Int. Electron Device Meeting (IEDM 2013), Washington, DC, USA, Dec. 9-11, 2013.
• (Invited talk) K. J. Chen, "Toward GaN-based Power Integrated Circuits," The 2^nd Int. Conf. on Advanced Electromaterials (ICAE 2013), Nov. 12-15, 2013, ICC Jeju, Korea.
• C. Liu, S. Liu, S. Huang, B. Li, and K. J. Chen, "AlN/GaN heterostructure TFTs with the polarized AlN barrier grown by 300 ^oC plasma enhanced atomic layer epitaxy," 10^th Topical Workshop on Heterostructure Microelectronics (TWHM-10), Sep. 2-5, 2013, Hakodate, Japan.
• (Invited talk) K. J. Chen, Technologies for III-N Heterogeneous Mixed-signal Electronics," 10^th Int. Conf. on Nitride Semiconductors (ICNS-10), Washington, DC, USA, Aug. 25-30, 2013.
• B. Li, K. J. Chen, Q. Jiang, S. Liu, and C. Liu "Degradation of OFF-state leakage current in AlGaN/GaN HEMTs induced by an ON-state gate overdrive," 10^th Int. Conf. on Nitride Semiconductors (ICNS-10), Washington, DC, USA, Aug. 25-30, 2013. (Outstanding poster award)
• S. Yang, J. Lu, S. Huang, C. Zhou, B. Huang, and K. J. Chen, "GaN Buffer Traps in GaN-on-Si Structure Studied by Thermally Stimulated Current and Back-Gating Measurements," 10^th Int. Conf. on Nitride Semiconductors (ICNS-10), Washington, DC, USA, Aug. 25-30, 2013.
• S. Huang, K. Wei, X. Liu, G. Liu, B. Shen, and K. J. Chen, "Improved High-Temperature Stability of 2DEG Channel in AlGaN/GaN Heterostructures by PEALD-grown AlN Thin Film Passivation," 10^th Int. Conf. on Nitride Semiconductors (ICNS-10), Washington, DC, USA, Aug. 25-30, 2013.
• S. Yang, Q. Jiang, B. Li, Z. Tang and K. J. Chen, "GaN-to-Si Vertical Conduction Mechanisms in AlGaNjGaN-on-Si Lateral Heterojunction FET Structures," 10^th Int. Conf. on Nitride Semiconductors (ICNS-10), Washington, DC, USA, Aug. 25-30, 2013.
• C. Liu, S. Liu, S. Huang, B. Li, and K. J. Chen, "AlN/GaN heteostructure TFTs with plasma enhanced atomic layer deposition of epitaxial AlN thin film," 10^th Int. Conf. on Nitride Semiconductors (ICNS-10), Washington, DC, USA, Aug. 25-30, 2013.
• Y. Wang, M. Wang, B. Xie, J. Wang, Y. Hao, W. Wu, B. Shen, and K. J. Chen, "High Performance Normally-Off AlGaN/GaN MOSFET with Al₂O₃ High-k Dielectric Layer Using a Low Damage Recess Technique," 10^th Int. Conf. on Nitride Semiconductors (ICNS-10), Washington, DC, USA, Aug. 25-30, 2013.
• Q. Jiang, C. Liu, Y. Lu, and K. J. Chen, "High-voltage enhancement/depletion-mode AlGaN/GaN HEMTs on modified SOI substrates," 2013 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'13), May 26-30, 2013, Kanazawa, Japan. (Charitat Award: for the best Young Researcher)
• Z. Tang, S. Huang, Q. Jiang, S. Liu, C. Liu, and K. J. Chen, "600 V high-performance AlGaN/GaN HEMTs with AlN/SiNx passivation," 2013 Compound Semiconductor Manufacturing Technology Conference CS MANTECH, Boston, USA, Apr. 23-26, 2012. (Best student paper award)
• Z. Tang, S. Huang, Q. Jiang, S Liu, C. Liu, and K. J. Chen, "600V 1.3mΩ∙cm² Low-Leakage Low-Current-Collapse AlGaN/GaN HEMTs with AlN/SiN_x Passivation," 2013 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'13), May 26-30, 2013, Kanazawa, Japan.
• Q. Zhou, W. Chen, S. Liu, B. Zhang, Z. Feng, S. Cai, and K. J. Chen, "High Breakdown Voltage InAlN/AlN/GaN HEMTs Achieved by Schottky-Source Technology," 2013 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'13), May 26-30, 2013, Kanazawa, Japan.
• (Invited talk) K. J. Chen, "Device technology for GaN mixed-signal integrated circuits," 5^th Int. Symp. On Advanced Plasma Science and its Applications for Nitrides and Nanomaterials (ISPlasma2013), Jan. 28-Feb. 1, 2013, Nagoya University, Japan.

2012:

• A. M. H. Kwan, X. Liu, and K. J. Chen, "Integrated gate-protected HEMTs and mixed-signal functional blocks for GaN smart power ICs," 2012 Int. Electron Device Meeting (IEDM2012), San Francisco, USA, Dec. 10-12, 2012.
• (Invited talk) K. J. Chen, L. Yuan, and H. Chen, "AlGaN/GaN metal-2DEG tunnel junction FETs with normally-off operation, high on-state current and low off-state leakage," 2012 IEEE Int. Conf. on Solid-State and Integrated Circuit Technology (ICSICT2012), Xi'an, CHINA, Oct. 29- Nov. 1, 2012.
• A. M. H. Kwan, Y. Guan, X. Liu, and K. J. Chen, "Over-temperature protection integrated circuit for GaN smart power ICs," 2012 Int. Workshop on Nitride Semiconductors (IWN2012), Oct. 14-19, 2012, Sapporo, Japan.
• (Invited talk) S. Yang, S. Huang, Q. Zhao, and K. J. Chen, "Enhancement-mode AlGaN/GaN MISHEMTs with fluorinated high-k LaLuO₃ gate dielectric," 2012 Int. Workshop on Nitride Semiconductors (IWN2012), Oct. 14-19, 2012, Sapporo, Japan.
• S. Huang, Q. Jiang, S. Yang, Z. Tang, and K. J. Chen, "Mechanism of PEALD-grown AlN passivation of AlGaN/GaN HEMTs," 2012 Int. Workshop on Nitride Semiconductors (IWN2012), Oct. 14-19, 2012, Sapporo, Japan.
• X. Liu, C. Zhan, K. W. Chan, W. Liu, L. S. Tan, K. J. Chen and Y.-C. Yeo, "AlGaN/GaN-on-Sapphire MOS-HEMTs with breakdown voltage of 1400 V and on-state resistance of 22 mW∙cm² using a CMOS-compatible gold-free process," 2012 International Conference on Solid State Device and Materials (SSDM2012), Kyoto, Japan, Sep. 25-27, 2012.
• C. Zhou, Q. Jiang, S. Huang, and K. J. Chen, "Vertical leakage/breakdown mechanisms in AlGaN/GaN-on-Si structure," 2012 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD'12), Bruges, Belgium. June 4-7, 2012.
• S. Huang, Q. Jiang, S. Yang, C. Zhou, and K. J. Chen, "ALD-grown ultrathin AlN film for passivation of AlGaN/GaN HEMTs," 2012 CS MANTECH, Boston, USA, Apr. 23-26, 2012.
• X. Liu, C. Zhan, K. W. Chan, W. Liu, L. S. Tan, K. J. Chen and Y.-C. Yeo, "AlGaN/GaN-on-Silicon MOS-HEMTs with Breakdown Voltage of 800 V and On-State Resistance of 3 mΩ.cm² using a CMOS-Compatible Gold-Free Process," 2012 Int. Symp. on VLSI Technology, Systems, and Applications (VLSI-TSA), Hsinchu, Taiwan, Apr. 23-25, 2012.
• (Invited) K. J. Chen, "Fluorine Plasma Ion Implantation: a GaN Normally-off HEMT Technology" 4^th Int. Symp. On Advanced Plasma Science and its Application for Nitrides and Nanomaterials (ISPlasma2012), Aichi, Japan, Mar. 4-8, 2012.

2011:

• (Invited) K. J. Chen, L. Yuan, M.J. Wang*, H. Chen, S. Huang*, C. Zhou, Q. Zhou, B.K. Li, J. N. Wang, "Physics of Fluorine Plasma Ion Implantation for GaN Normally-off HEMT Technology", 2011 Int. Electron Device Meeting (IEDM), Washington D. C., USA, Dec. 4-7, 2011.
• Q. Zhou, S. Huang*, H. Chen, C. Zhou, Z. Feng, S. Cai, K. J. Chen, "Schottky Source/Drain Al₂O₃/InAlN/GaN MIS-HEMT with Steep Sub-threshold Swing and High ON/OFF Current Ratio", 2011 Int. Electron Device Meeting (IEDM), Washington D. C., USA, Dec. 4-7, 2011.
• Qi Zhou, Hongwei Chen, Chunhua Zhou, Z.H. Feng, S.J. Cai and K. J. Chen, "InAlN/AlN/GaN Schottky source/drain MIS-HEMT with high breakdown voltage," 2011 Int. Conf. on Solid-State Devices and Materials (SSDM2011), Nagoya, Japan, Sep. 28-30, 2011.
• S. Huang, S. Yang, J. Roberts, and K. J. Chen, "Characterization of Vth-instability in Al₂O₃/GaN/AlGaN/GaN MIS-HEMTs by quasi-static C-V measurement," 9^th Int. Conf. on Nitride Semiconductors (ICNS-9), Glasgow, UK, July 10-15, 2011
• H. Chen, L. Yuan, Q. Zhou, C. Zhou, and K. J. Chen, "Normally-off AlGaN/GaN Power Tunnel-Junction FETs," 9^th Int. Conf. on Nitride Semiconductors (ICNS-9), Glasgow, UK, July 10-15, 2011.
• Q. Zhou, H. Chen, C. Zhou, Z. Feng, S. J. Cai, and K. J. Chen, "Observation  Observation of Trap-Assisted Steep Sub-threshold Swing in Schottky Source/Drain Al₂O₃/InAlN/GaN MISHEMT," 69^th Device Research Conference (DRC), Santa Barbara, CA, USA, June 20-22, 2011.
• J. Fu, L. Yobas, and K.J. Chen, "Stealth electrode dielectrophoresis: Microsphere manipulation by patterned 2-Dimensional Electron Gas (2-DEG) in AlGaN/GaN heterostructures," The 3rd International Symposium on Microchemistry and Microsystems (ISMM), Seoul, Korea, June 2-4, 2011, Abstract: F3-056.
• L. Yuan, H. Chen, Q. Zhou, C. Zhou, and K. J. Chen, "A novel normally-off GaN power tunnel junction FET," The 23^rd Int. Symp. on Power Semiconductor Devices and ICs (ISPSD'11), San Diego, USA, May 23-26, 2011.
• J. N. Lv, Z. C. Yang, G. Z. Yan, Y. Cai, B. S. Zhang, and K. J. Chen, "Characterization of GaN cantilevers fabricated with GaN-on-Si platform," IEEE MEMS 2011. Jan. 23-27, 2011, Cancun, Mexico.
• (Invited) K. J. Chen, "Role of Fluorine Plasma Ion Implantation in GaN Electron Devices," SPIE Photonics West Conference, OPTO, San Francisco, USA, Jan. 22-27, 2011.

2010:

• C. Ma, H. Chen, C. Zhou, S. Huang, L. Yuan, J. Roberts, and K. J. Chen, "Reliability of Enhancement-mode AlGaN/GaN HEMTs under ON-state Gate Overdrive," 2010 Int. Electron Device Meeting (IEDM), San Francisco, USA, Dec. 4-7, 2010.
• (Invited) K. J. Chen and C. Zhou "GaN Smart Discrete Power Devices," The 10^th Int. Conf. on Solid-State and Integrated-Circuit Technology (ICSICT08), Shanghai, China, Nov. 1-4, 2010.
• (Invited) K. J. Chen, "GaN Smart Power IC Technologies," IEEE University Government Industry Micro/Nano Symposium (UGIM 2010), Purdue University, West Lafayette, IN, USA, June 28-July 1, 2010.
• (Invited) K. J. Chen, "Enhancement-mode AlGaN/GaN HEMT and MIS-HEMT Technology," The 37^th Int. Symp. On Compound Semiconductors (ISCS2010), Takamatsu Symbol Tower, Kagawa, Japan, May 31-June 4, 2010.
• A. M. H. Kwan, K. -Y. Wong, X. Liu, and K. J. Chen, "High-Gain and High-Bandwidth AlGaN/GaN HEMT Comparator," 2010 Int. Conf. on Solid-State Devices and Materials (SSDM2010), Tokyo, Japan, Sep. 22-24, 2010.
• J. Fu and K. J. Chen, "Microspheres manipulation and sensing system by AlGaN/GaN 2DEG," Int. Workshop on Nitride Semiconductors (IWN2010), Tampa, Florida, USA, Sep. 19-24, 2010. (oral presentation)
• S. Huang, H. Chen, and K. J. Chen, "Effects of the fluorine plasma treatment on the surface potential and Schottky barrier height of AlGaN/GaN heterostructures," Int. Workshop on Nitride Semiconductors (IWN2010), Tampa, Florida, USA, Sep. 19-24, 2010. (oral presentation)
• B. K. Li, M. J. Wang*, K. J. Chen, J. N. Wang, "Electroluminenscence from forward biased Ni/Au-AlGaN/GaN Schottky diodes," The 30^th Int. Conf. on the Physics of Semiconductors (ICPS 2010), Seoul, Korea, July 25-30, 2010. (oral presentation)
• H. Chen, M. Wang*, and K. J. Chen, "Self-Aligned Enhancement-mode AlGaN/GaN HEMTs Using 25 keV Fluorine Ion Implantation," The 68^th Device Research Conference (DRC10) , University of Notre Dame, South Bend, Indiana, USA, June 21-23, 2010.
• C. Zhou, W. J. Chen*, E. L. Piner, and K. J. Chen, "Self-Protected GaN Power Devices with Reverse Drain Blocking and Forward Current Limiting Capabilities," The 22^nd Int. Symp. on Power Semiconductor Devices and ICs (ISPSD'10), Hiroshima, Japan, June 6-10, 2010 (Charitat Award: for the best Young Researcher)
• C. Zhou, W. J. Chen*, E. L. Piner, and K. J. Chen, "AlGaN/GaN Dual-Channel Lateral Field-Effect Rectifier with Punch-through Breakdown Immunity and Low On-Resistance," 2010 Int. Conf. on Compound Semiconductor Manufacturing Technology (CS MANTECH), Portland, Oregon, USA, May 7-10, 2010.
• H. Chen, M. Wang*, and K. J. Chen, "Enhancement-mode AlGaN/GaN HEMTs Fabricated by Standard Fluorine Ion Implantation," 2010 Int. Conf. on Compound Semiconductor Manufacturing Technology (CS MANTECH), Portland, Oregon, USA, May 7-10, 2010.
• J. N. Lv, Z.C. Yang, G.Z. Yan, Y. Cai, B.S. Zhang and K.J. Chen, "Residual Stress Characterization of GaN Microstructures Using Bent-Beam Strain Sensors," The 5th Annual IEEE Int. Conf. on Nano/Micro Engineering and Molecular Systems (IEEE-NEMS 2010), Xiamen, China, Jan. 20-23, 2010.

2009:

• (Invited) K. J. Chen, K. -Y. Wong, W. J. Chen, C. Zhou, and X. Liu, "Device Technology Platform for GaN Smart Power ICs," 2009 Int. Electron Device and Material Symposium (IEDMS2009), Taoyuan, Taiwan, Nov. 18-21, 2009.
• B. K. Li, M. J. Wang, K. J. Chen, and J. N. Wang, "Electronluminescence from a forward biased Ni/Au-AlGaN/GaN Schottky diode: evidence of Femi level depinning at Ni/AlGaN interface," 8th Int. Conf. on Nitride Semiconductors (ICNS-8), Jeju, Korea, Oct. 18-23, 2009.
• K. -Y. Wong, W. J. Chen, X. Liu, C. Zhou, and K. J. Chen, "GaN Smart Power IC Technology," 8th Int. Conf. on Nitride Semiconductors (ICNS-8), Jeju, Korea, Oct. 18-23, 2009.
• M. J. Wang, K. J. Chen, C. Cheng, C. D. Beling, and S. Fung, "Modulation of Polarization Induced Electric Field by Fluorine Ions in AlGaN/GaN Heterostructures Revealed by Positron Annihilation Spectroscopy," 8th Int. Conf. on Nitride Semiconductors (ICNS-8), Jeju, Korea, Oct. 18-23, 2009.
• K. -Y. Wong, W. J. Chen, and K. J. Chen, "GaN Zero-Bias RF Mixer Using a Lateral Field-Effect Rectifier," 2009 Int. Conf. on Solid-State Devices and Materials (SSDM2009),Sendai, Miyagi Japan, Oct. 7-9, 2009.
• Q. Zhou, K. -Y. Wong, W. J. Chen, and K. J. Chen, "Zero-Bias Microwave Detectors Using AlGaN/GaN HEMT-Compatible Lateral Field-Effect Rectifier (L-FER)," 8th Topical Workshop on Heterostructure Microelectronics (TWHM2009), Mielparque-Nagano, Nagano, Japan, Aug. 25-28, 2009.
• K. -Y. Wong, W. J. Chen, and K. J. Chen, "Integrated Voltage Reference and Comparator Circuits for GaN Smart Power Chip Technology," 2009 Int. Symp.. on Power Semiconductor Devices and ICs (ISPSD'09), Barcelona, Spain, June 14-17, 2009. (Charitat Award: for the best Young Researcher)
• K. -Y. Wong, W. J. Chen, and K. J. Chen, "Wide Bandgap GaN Smart Power Chip Technology," 2009 Int. Conf. on Compound Semiconductor Manufacturing Technology (CS Matech'09), Tampa, Florida, USA, May 18-21, 2009.

2008:

• W. Chen, K. -Y. Wong, and K. J. Chen, "Monolithic Integration of Lateral Field Effect Rectifier with Normally-off HEMT for GaN-on-Si Switch-mode Power Supply Converters," 2008 Int. Electron Device Meeting (IEDM08), San Francisco, USA, Dec. 15-17, 2008.
• M. Wang and K. J. Chen, "Source Injection Induced Off-State Breakdown and Its Improvement by Enhanced Back Barrier with Fluorine Ion Implantation in AlGaN/GaN HEMTs," 2008 Int. Electron Device Meeting (IEDM08), San Francisco, USA, Dec. 15-17, 2008.
• L. Yuan, M. Wang, and K. J. Chen, "Atomistic Modeling of Fluorine Implantation and Diffusion in III-Nitride Semiconductors," 2008 Int. Electron Device Meeting (IEDM08), San Francisco, USA, Dec. 15-17, 2008.
• (Invited) K. J. Chen, "Threshold Voltage Control in AlGaN/GaN HEMTs by Fluorine Plasma Ion Implantation: From Normally-ON to Normally-OFF," 15^th National Conference on Compound Semiconductor: Materials, Microwave and Optoelectronic Devices, Guangzhou, China, Dec. 1-2, 2008.
• (Invited) K. J. Chen, "Fluorine Plasma Ion Implantation (Treatment) Technology: a New Dimension in GaN Electronic Device Processing," The 9^th Int. Conf. on Solid-State and Integrated-Circuit Technology (ICSICT08), Beijing, China, Oct. 20-23, 2008.
• W. Chen, K. -Y. Wong, W. Huang, and K. J. Chen, "High Temperature Operation of Normally-off AlGaN/GaN Power HEMTs using CF4 Plasma Treatment," The 9^th Int. Conf. on Solid-State and Integrated-Circuit Technology (ICSICT08), Beijing, China, Oct. 20-23, 2008.
• L. Yuan, M. Wang, and K. J. Chen, "Molecular Dynamics Simulation Study on Fluorine Plasma Ion Implantation in AlGaN/GaN Heterostructures," The 9^th Int. Conf. on Solid-State and Integrated-Circuit Technology (ICSICT08), Beijing, China, Oct. 20-23, 2008.
• W. Chen, K. -Y. Wong, and K. J. Chen, "HEMT-Compatible Lateral Field Effect Rectifier Using CF4 Plasma Treatment," 2008 Int. Workshop on Nitride Semiconductors (IWN2008), Montreux, Switzerland, Oct. 6-10, 2008.
• M. Wang, L. Yuan, F. Xu, B. Shen, and K. J. Chen, "Study of Diffusion and Thermal Stability of Fluorine Ions in GaN by Time-of-Flight Secondary Ion Mass Spectroscopy," 2008 Int. Workshop on Nitride Semiconductors (IWN2008), Montreux, Switzerland, Oct. 6-10, 2008.
• L. Yuan, M. Wang, and K. J. Chen, "On the Stability of Fluorine Ions in AlGaN/GaN Heterostructures: a Molecular Dynamics Simulation Study," 2008 Int. Workshop on Nitride Semiconductors (IWN2008), Montreux, Switzerland, Oct. 6-10, 2008.
• K. -Y. Wong, W. Chen, and K. J. Chen, "High Temperature Performance of AlGaN/GaN HEMT-Compatible Lateral Field Effect Rectifier," 2008 Int. Conf. Solid-State Devices and Materials (SSDM08), Tsukuba, Japan, Sep. 23-26, 2008.
• L. Yuan, M. Wang, and K. J. Chen, "On the Stability of Fluorine Ions in AlGaN/GaN System: a Theoretical Study," 2008 Int. Conf. Solid-State Devices and Materials (SSDM08), Tsukuba, Japan, Sep. 23-26, 2008.
• W. Chen, W. Huang, K. Y. Wong, and K. J. Chen, "High-Performance AlGaN/GaN HEMT-Compatible Lateral Field-Effect Rectifiers," 66th Device Research Conference (DRC), Santa Barbara, California, USA, June 22-25, 2008.
• J. Lv, Z. Yang, and K. J. Chen, "Fabrication of Suspending GaN Microstructures with Combinations of Anisotropic and Isotropic Dry Etching Techniques," Proc. Of ASME Nano08, Clear Water Bay, Hong Kong, Kowloon, Hong Kong, June 3-5, 2008.
• (Invited) K. J. Chen, "Core Technologies for III-Nitride Integrated Microsensors," 2008 HKUST Nanotechnology Workshop, HKUST, Jan 23-25, 2008.

2007:

• C. Yi, R. Wang, W. Huang, T. C. -W. Tang, K. M. Lau, and K. J. Chen, "Reliability of Enhancement-mode AlGaN/GaN HEMTs Fabricated by Fluorine Plasma Treatment," 2007 International Electron Device Meeting (IEDM07), Washington D. C., USA, Dec. 10-12, 2007.
• B. K. Li, K. J. Chen, K. M. Lau, W. Ge, and J. N. Wang, "Characterization of Fluorine-Plasma Induced Deep Centers in AlGaN/GaN Heterostructures," 7^th Int. Conf. Nitride Semiconductors (ICNS-7), Sep. 16-21, 2007, Las Vegas, Nevada, USA.
• R. Wang, Y. C. Wu, W. C. -W. Tang, K. M. Lau, and K. J. Chen, "Gain Improvement of Enhancement-mode AlGaN/GaN HEMT using Dual-gate Architectures," 2007 Int. Conf. Solid-State Devices and Materials (SSDM07), Tsukuba, Japan, Sep. 18-21, 2007.
• K. Y. Wong, W. C. -W. Tang, K. M. Lau, and K. J. Chen, "Two-dimensional Electron Gas (2DEG) IDT SAW Devices on AlGaN/GaN Heterostructures," IEEE-NANO 2007, Hong Kong, Aug. 2-5, 2007.
• C. Wang, Z. Yang, B. Zhang, Y. Wang, H. Wang, K. M. Lau, and K. J. Chen, "Fabrication of Vertical Position-Controlled GaN Nanowires on (111) Si Substrate," IEEE-NANO 2007, Hong Kong, Aug. 2-5, 2007
• J. Liu, D. Song, Z. Cheng, W. C. -W Tang, K. M. Lau, and K. J. Chen, "Microwave Noise Characterization of Enhancement-mode AlGaN/GaN/InGaN/GaN Double-Heterojunction HEMTs," IEEE 65th Device Research Conference, South Bend, Indiana, USA, June 18-20, 2007, pp. 77-78.
• D. Song, J. Liu, Z. Cheng, W. C. -W. Tang, K. M. Lau, and K. J. Chen, "Normally-off AlGaN/GaN Low-Density-Drain HEMTs (LDD-HEMT) with Enhanced Breakdown Voltage and Suppressed Current Collapse," IEEE 19th Int. Symp. on Power Semiconductor Devices & ICs (ISPSD'07), Jeju, Korea, May 27-30, 2007, pp. 257-260.
• J. Zhang, H. Zhang, K. J. Chen, S. G. Lu, and Z. Xu, "Microwave Performance Dependence of BST Thin Film Planar Interdigitated Varactors on Different Substrate," IEEE Int. Conf. on Nano/Micro Engineering and Molecular Systems (IEEE-NEMS 2007), Bangkok, Thailand, Jan. 16-19, 2007.
• Z. Yang, B. Zhang, K. M. Lau, and K. J. Chen, "Fabrication of Position-Controllable GaN Nanostructures," IEEE Int. Conf. on Nano/Micro Engineering and Molecular Systems (IEEE-NEMS 2007), Bangkok, Thailand, Jan. 16-19, 2007.

2006:

• R. N. Wang, Y. Cai, Z. Cheng, C. W. Tang, K. M. Lau, and K. J. Chen. "A Planar Integration Process for E/D-mode AlGaN/GaN HEMT DCFL Integrated Circuits," 2006 IEEE Compound Semiconductor IC Symposium, San Antonio, USA, Nov. 12-15, 2006.
• R. N. Wang, Y. Cai, Z. Cheng, C.-W. Tang, K. M. Lau, and K. J. Chen, "Enhancement-Mode AlGaN/GaN Metal Insulator Semiconductor HFETs Using Fluoride-Based Plasma Treatment Technique" Int. Workshop on Nitride Semiconductors (IWN2006), Kyoto, Japan, Oct. 22-27, 2006.
• Z. Yang, B. Zhang, K. M. Lau, and K. J. Chen, "SiN-Masked GaN-on-Patterned-Silicon (GPS) Technique for fabrication of suspended GaN microstructures." The 8th Int. Conf. Solid-State and Integrated-Circuit Technology (ICSICT-2006), Shanghai, China, Oct. 23-26, 2006.
• J. W. Zhang, Wai Cheong Hon, Lydia L. W. Leung, and K. J. Chen, "Fabrication of Edge-Suspended Microwave Passive Components using CMOS-Compatible Micromachining,"The 8th Int. Conf. Solid-State and Integrated-Circuit Technology (ICSICT-2006),  Shanghai, China, Oct. 23-26, 2006.
• K.-Y. Wong, W.-Y. Tam, and K. J. Chen, "Analysis of SAW Filter Fabricated on Anisotropic Substrate Using Finite-Difference Time-Domain Method," IEEE Ultrasonics Symposium, Vancouver, Canada, Oct. 2-6, 2006. (oral presentation)
• K.-Y. Wong, W. C. W. Tang, K. M. Lau, and K. J. Chen, "Planar Integration of SAW Filter with HEMT on AlGaN/GaN Heterostructure Using Fluoride-based Plasma Treatment," IEEE Ultrasonics Symposium, Vancouver, Canada, Oct. 2-6, 2006. (oral presentation).
• Y. Cai, Z. Q. Cheng, W. C. -W. Tang, K. M. Lau, and K. J. Chen, "GaN-based Direct-Coupled FET Logic (DCFL) Digital Circuits Operating at 375 ^oC," 2006 Int. Conf. on Solid State Devices and Materials (SSDM 2006), Yokohama, Japan, Sep. 12-15, 2006.
• R. Wang, Y. Cai, C. -W. Tang, K. M. Lau, and K. J. Chen, "Device Isolation by Plasma Treatment for Planar Integration of E/D-mode AlGaN/GaN HEMTs," 2006 Int. Conf. on Solid State Devices and Materials (SSDM 2006), Yokohama, Japan, Sep. 12-15, 2006.

• H. Zhang and K. J. Chen, "A Microstrip Bandpass Filter with an Electronically Reconfigurable Transmission Zero," 2006 European Microwave Conference (EUMW2006), Manchester, U. K., Sep. 10-15, 2006.
• (Invited) K. J. Chen and K. M. Lau, "Core Technologies for III-Nitride Integrated Microsensors," 6th Emerging Information Technology Conference (EITC'06), Richardson, Texas, USA, Aug. 10-13, 2006.
• L. L. W. Leung and K. J. Chen, "Compact On-Chip Three-Dimensional Electromagnetic Bandgap Structure,"2006 IEEE International Microwave Symposium (IMS2006), San Francisco, USA, June 6-11, 2006.
• C-W. Tang, L. Jiang, K. M. Lau, and K. J. Chen, "MOCVD Grown Metamorphic InAlAs/InGaAs HEMTs on GaAs Substrates," 2006 Int. Conf. Compound Semiconductor Manufacturing Technology (MANTECH'06), Vancouver, Canada, Apr. 24-27, 2006, pp. 243-245.

2005:

• Z. Yang, R. Wang, D. Wang, B. Zhang. K. J. Chen, and K. M. Lau, "GaN on Patterned Silicon (GPS) Technique for GaN based Integrated Microsensors," 2005 International Electron Device Meeting (IEDM05), Washington D. C., USA, Dec. 4-7, 2005.
• Y. Cai, Z. Cheng, C. W. Tang, K. J. Chen, and K. M. Lau, "Monolithic Integration of Enhancement- and Depletion-mode AlGaN/GaN HEMTs for GaN Digital Integrated Circuits," 2005 International Electron Device Meeting (IEDM05), Washington D. C., USA, Dec. 4-7, 2005.
• Z. Cheng, Y. Cai, J. Liu, Y. G. Zhou, K. M. Lau, and K. J. Chen, "Monolithic Integrated C-band Low Noise Amplifier Using AlGaN/graded-AlGaN/GaN HEMTs," Proceeding of 2005 Asia-Pacific Microwave Conference (APMC2005), Suzhou, China, Dev. 4-7, 2005.
• H. Zhang and K. J. Chen, "Compact Bandpass Filters Using Slow-Wave Coplanar Waveguide Tri-Section Stepped Impedance Resonators," Proceeding of 2005 Asia-Pacific Microwave Conference (APMC2005), Suzhou, China, Dev. 4-7, 2005.
• H. Zhang, J. W. Zhang, L. L. W. Leung, and K. J. Chen, "Bandpass and Bandstop Filters Using CMOS-Compatible Micromachined Edge-Suspended Coplanar Waveguides," Proceeding of 2005 Asia-Pacific Microwave Conference (APMC2005), Suzhou, China, Dev. 4-7, 2005.
• J. Liu, Y. G. Zhou, J. Zhu, K. J. Chen, and K. M. Lau, "AlGaN/GaN/InGaN/GaN HEMTs with an InGaN-notch," 6th Int. Conf. on Nitride Semiconductors,(ICNS-6), Bremen, Germany, Aug. 28-Sep. 2, 2005.
• Z. Yang, R. Wang, S. Jia, D. Wang, B. Zhang, K. J. Chen, and K. M. Lau, "Fabrication of Suspended GaN Microstructures Using GaN on Patterned Silicon (GPS) Technique," 6th Int. Conf. on Nitride Semiconductors,(ICNS-6), Bremen, Germany, Aug. 28-Sep. 2, 2005.
• J. Zhu, J. Liu, Y. G. Zhou, Y. Cai, K. J. Chen, and K. M. Lau, "Reduced Gate-bias dependence of 2DEG mobility in a Composite-Channel HEMT,"6th Int. Conf. on Nitride Semiconductors,(ICNS-6), Bremen, Germany, Aug. 28-Sep. 2, 2005.
• S. Jia, Y. Cai, D. Wang, B. Zhang, K. J. Chen, and K. M. Lau, "Enhancement-Mode AlGaN/GaN HEMTs on Silicon Substrate,"6th Int. Conf. on Nitride Semiconductors,(ICNS-6), Bremen, Germany, Aug. 28-Sep. 2, 2005.
• Z. Feng, S. J. Cai, K. J. Chen, and K. M. Lau, "AlGaN/GaN HEMTs on Grooved Sapphire Substrate,"6th Int. Conf. on Nitride Semiconductors,(ICNS-6), Bremen, Germany, Aug. 28-Sep. 2, 2005.
• Y. Cai, Y. G. Zhou, K. J. Chen, and K. M. Lau, "Enhancement-mode AlGaN/GaN HEMTs with Low On-Resistance and Low Knee-Voltage,"6th Topical Workshop on Heterostructure Microelectronics, (TWHM2005), Awaji Island, Hyogo, Japan, Aug. 22-25, 2005.
• (Invited) K. J. Chen, J. Liu, Y. G. Zhou, and K. M. Lau, "Channel Engineering of III-Nitride HEMTs for Enhanced Device Performance," 2005 Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices (AWAD05), Seoul, Korea, June 27-29, 2005.
• Y. Cai, Y. G. Zhou, K. J. Chen, and K. M. Lau, "Threshold Voltage Control of AlGaN/GaN HEMTs by CF4 Plasma Treatment," 2005 Electronic Material Conference (EMC2005), Santa Barbara, California, USA, June 22-24, 2005.
• M. Chen, W. Zhou, J. Zhu, Y. Cai, W. C. K. Tang, K. J. Chen, and K. M. Lau, "Metamorphic InP/GaAsSb/InP HBTs on GaAs substrate by MOCVD," 2005 Electronic Material Conference (EMC2005), Santa Barbara, California, USA, June 22-24, 2005.
• Y. Cai, Y. G. Zhou, K. J. Chen, and K. M. Lau, "Self-Aligned Enhancement-Mode AlGaN/GaN HEMTs Using Fluoride-based Plasma Treatment," 63rd Device Research Conference (DRC), Santa Barbara, California, USA, June 20-22, 2005.
• Z. Yang, S. Jia, R. Wang, D. Wang, K. J. Chen, and K. M. Lau, "GaN on Patterned Silicon (GPS) Technique for Fabrication of GaN-based MEMS," 13th Int. Conf. Solid-State Sensors, Actuators, and Microsystems (TRANSDUCERS'05), Seoul, Korea, June 5-9, 2005.
• C. S. Chu, Y. G. Zhou, K. J. Chen, and K. M. Lau, "A novel RF High-Q metal-semiconductor-metal planar inter-digitated varactor based on double-channel AlGaN/GaN HEMT structure," 2005 IEEE Radio-Frequency Integrated Circuit Symposium (RFIC2005), Long Beach, USA, June 12-14, 2005.

2004:

• J. Liu, Y. G. Zhou, R. M. Chu, Y. Cai, K. J. Chen, and K. M. Lau,"Al0.3Ga0.7N/Al0.05Ga0.95N/GaN Composite-Channel HEMTs with Enhanced Linearity," 2004 International Electron Device Meeting (IEDM04), San Francisco, USA, Dec. 13-15, 2004.
• S. Jia, K. K. P. Tsui, X. P. Liao, and K. J. Chen, "Characterization and modeling of a step-gate-oxide MOSFET for RF power amplifiers," The 7th Int. Conf. on Solid-State and Integrated-Circuit Technology (ICSICT2004), Beijing, China, Oct. 18-21, 2004.
• J. -W. Zhang, W. C. Hon, L. L. W. Leung, and K. J. Chen, "Fabrication of edge-suspended microwave passive components using CMOS-compatible micromachining," The 7th Int. Conf. on Solid-State and Integrated-Circuit Technology (ICSICT2004), Beijing, China, Oct. 18-21, 2004.
• C. S. Chu, Y. G. Zhou, R. M. Chu, K. J. Chen, and K. M. Lau, "GaN-based radio-frequency planar inter-digitated metal-insulator-semiconductor varactors," The 7th Int. Conf. on Solid-State and Integrated-Circuit Technology (ICSICT2004), Beijing, China, Oct. 18-21, 2004.
• M. Wong, N. Fok, N. Fan, K. W. Chan, and K. J. Chen, "High-performance low-cost embedded inductors using thin array plastic packaging (TAPP) for RF/microwave applications, ," 2004 European Microwave Conference (EuMW2004) , Amsterdam, Netherland, Oct. 12-14, 2004.
• L. L. W. Leung, J. -W. Zhang, W. C. Hon, and K. J. Chen, "High-performance CMOS-compatible micromachined edge-suspended coplanar waveguides on low-resistivity silicon substrate," 2004 European Microwave Conference (EuMW2004) , Amsterdam, Netherland, Oct. 12-14, 2004.
• J. -W. Zhang, W. C. Hon, L. L. W. Leung, and K. J. Chen, "High-performance edge-suspended spiral inductors and CPWs on CMOS-grade silicon substrates,"2004 International Conference on Microwave and Millimeter Wave Technology(ICMMT2004), Beijing, China, Aug. 18-21, 2004.
• Y. G. Zhou, R. M. Chu, J. Liu, K. J. Chen, and K. M. Lau,"Gate Leakage in AlGaN/GaN HEMTs and its Suppression by Optimization of MOCVD Growth," 2004 International Workshop on Nitride Semiconductors, Pittsburgh, Pennsylvania, USA, July 19-23, 2004.
• R. M. Chu, Y. G. Zhou, J. Liu, K. J. Chen, and K. M. Lau,"Reduction of Current Collapse in an un-passivated AlGaN-GaN Double-Channel HEMT," 2004 Electronic Material Conference (EMC2004), Notre Dame, Indiana, USA, June 23-25, 2004.
• D. Wang, S. Jia, K. J. Chen, K. M. Lau, Y. Dikme, P. van Gemmern, Y. C. Lin, and M. Heuken "Quantitative Stress Characterization in GaN Films grown on patterned Si(111) by Micro-Raman Spectroscopy," 2004 Electronic Material Conference (EMC2004), Notre Dame, Indiana, USA, June 23-25, 2004.
• W. C. Hon, J. -W. Zhang, L. L. W. Leung, and K. J. Chen, "High-Q CMOS-Compatible Micromachined Edge-suspended Inductors,"2004 IEEE Radio Frequency Integrated Circuits Symposium (RFIC2004), Fort Worth, TX, USA, June 6-8, 2004.
• L. L. W. Leung and K. J. Chen, "Microwave Characterization of High Aspect Ratio Through-Wafer Interconnect Vias in Silicon substrates,"2004 IEEE International Microwave Symposium (IMS2004), Fort Worth, Texas, USA, June 6-11, 2004.
• D. Wang, Y. Dikme, S. Jia, P. van Gemmern, Y. C. Lin, K. J. Chen, K. M. Lau, and M. Heuken "Characterization of GaN grown on patterned Si(111) substrate," 12th Int. Conference on Metal Organic Vapor Phase Epitaxy (ICMOVPE-XII), Maui, Hawaii, USA, May 30-June 4, 2004.

2003:

• T. Suligoj, H. Liu, J. K. O. Sin, K. Tsui, K. J. Chen, P. Biljanovic, and K. L. Wang,"A Low-Cost Horizontal Current Bipolar Transistor (HCBT) Technology for the BiCMOS Integration with FinFETs,"IEEE Int. Semiconductor Device Research Symposium, Washington D. C., Dec. 10-12, 2003.
• L. L. W. Leung, W. C. Hon, and K. J. Chen,"Low-loss CPW Interconnects on Low-resistivity Silicon Substrate," Proceeding of 2003 Asia-Pacific Microwave Conference (APMC2003), pp. 1875-1878, Seoul, Korea, Nov. 4-7, 2003.
• L. L. W. Leung, T. W. Chen, S. W. Wong, M. H. Chan, and K. J. Chen,"A 2 GHz Single-chip Lumped-element Impedance Matching Network for RF Power Amplifiers on Standard Silicon Substrate," Proceeding of 2003 Asia-Pacific Microwave Conference (APMC2003), pp. 1836-1839, Seoul, Korea, Nov. 4-7, 2003.
• B. P. Yan, E. S. Yang, Y. F. Yang, X. Q. Wang, K. K. P. Tsui, and K. J. Chen,"RF Large Signal Characterization of InGaP/GaAs Power Heterostructure-emitter Bipolar Transistors," Proceeding of 2003 Asia-Pacific Microwave Conference (APMC2003), pp. 209-212, Seoul, Korea, Nov. 4-7, 2003.
• X. Huo, G. W. Xiao, K. J. Chen, and P.C. H. Chan,"System-on-Organic Integration of a 2.4 GHz VCO Using High Q Copper Inductors and Solder-bumped Flip Chip Technology," Proceeding of 2003 IEEE Custom Integrated Circuits Conference (CICC2003), San Jose, California, USA, Sep. 21-24, 2003, pp. 537-540.
• Y.G. Zhou, R. M. Chu, K. J. Chen, and K. M. Lau,"AlGaN/GaN/Graded-AlGaN double heterostructure HEMT," 2003 Int. Conf. Solid-State Devices and Materials (SSDM2003), Tokyo, Japan, Sep. 16-18, 2003, pp. 918-919.
• R. M. Chu, Y. G. Zhou, K. J. Chen, and K. M. Lau,"Trap States Induced Frequency Dispersion of AlGaN/GaN Heterostructure Field-Effect Transistors," 2003 Electronic Material Conference (EMC2003), Salt Lake City, Utah, USA, June, 25-27, 2003, p.85.
• R. M. Chu, Y. G. Zhou, K. J. Chen, and K. M. Lau,"Admittance Characterization and Analysis of Trap States in AlGaN/GaN Heterostructures," 5th Int. Conf. on Nitride Semiconductors, Nara, Japan, May 25-30, 2003, p. 275.
• X.P. Liao, K. Tsui, H. Liu, K. J. Chen, and J. K. O. Sin,"A Step-Gate-Oxide SOI MOSFET for RF Power Amplifiers in Short- and Medium-range Wireless Applications," 2003 IEEE MTT-S Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF2003), Grainau, Germany, pp. 33-36, April 9-11, 2003.

2002:

• K. Tsui, K. J. Chen, S. Lam, and M. Chan, "RF Power Characteristics of Thin Film Silicon-on-Sapphire MOSFET," 2002 Int. Conf. Solid State Devices and Materials (SSDM'2002), Nagoya, Japan, Sep. 17-20, 2002, pp. 594-595.
• Lydia L. W. Leung, K. J. Chen, X. Huo, and P.C.H. Chan, "On-Chip Microwave Filters on Standard Silicon Substrates Incorporating a low-k BCB Dielectric Layer," 2002 European Microwave Conference, Sep. 23-27, Milan, Italy.
• K. J. Chen, X. Huo, L. L. W. Leung, and P.C.H. Chan, "High-performance microwave passive components on silicon substrate," 3rd International Conference on Microwave and Millimeter Wave Technology (ICMMT2002), Aug. 17-19, Beijing, 2002, pp. 263-266.
• X. Huo, K. J. Chen, and P.C.H. Chan, "High-Q copper inductors on standard silicon substrate with a low-k BCB dielectric layer," Proceeding of 2002 IEEE RFIC Symposium, pp. 403-406, June 2-4, Seattle, USA.